VLSI and Circuits, Embedded and Hardware Systems Commons^™

A Theoretical Approach To Fault Analysis And Mitigation In Nanoscale Fabrics, Md Muwyid Uzzaman Khan

Masters Theses 1911 - February 2014

High defect rates are associated with novel nanodevice-based systems owing to unconventional and self-assembly based manufacturing processes. Furthermore, in emerging nanosystems, fault mechanisms and distributions may be very different from CMOS due to unique physical layer aspects, and emerging circuit and logic styles. Thus, theoretical fault models for nanosystems are necessary to extract detailed characteristics of fault generation and propagation. Using the intuition garnered from the theoretical analysis, modular and structural redundancy schemes can be specifically tailored to the intricacies of the fabric in order to achieve higher reliability of output signals.

In this thesis, we develop a detailed analytical …