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Full-Text Articles in Electronic Devices and Semiconductor Manufacturing
Charge Storage Characteristics Of Ultra-Small Pt Nanoparticle Embedded Gaas Based Non-Volatile Memory, Reginald Jeff, M Yun, B Ramalingam, B Lee, V Misra, Gregory Edward Triplett, Shubhra Gangopadhyay
Charge Storage Characteristics Of Ultra-Small Pt Nanoparticle Embedded Gaas Based Non-Volatile Memory, Reginald Jeff, M Yun, B Ramalingam, B Lee, V Misra, Gregory Edward Triplett, Shubhra Gangopadhyay
Electrical and Computer Engineering Publications
Charge storage characteristics of ultra-small Pt nanoparticle embedded devices were characterized by capacitance-voltage measurements. A unique tilt target sputtering configuration was employed to produce highly homogenous nanoparticle arrays. Pt nanoparticle devices with sizes ranging from ∼0.7 to 1.34 nm and particle densities of ∼3.3–5.9 × 1012 cm−2 were embedded between atomic layer deposited and e-beam evaporated tunneling and blocking Al2O3 layers. These GaAs-based non-volatile memory devices demonstrate maximum memory windows equivalent to 6.5 V. Retention characteristics show that over 80% charged electrons were retained after 105 s, which is promising for device applications.
Reduced Auger Recombination In Mid-Infrared Semiconductor Lasers, Robert Bedford, Gregory Edward Triplett, David H. Tomich, Stephan W. Koch, Jerome Moloney, Jorg Hader
Reduced Auger Recombination In Mid-Infrared Semiconductor Lasers, Robert Bedford, Gregory Edward Triplett, David H. Tomich, Stephan W. Koch, Jerome Moloney, Jorg Hader
Electrical and Computer Engineering Publications
A quantum-design approach to reduce the Auger losses in two micron InGaSb type-I quantum well edge-emitting lasers is reported. Experimentally realized structures show a 3X reduction in the threshold, which results in 4.6 lower Auger current loss at room temperature. This is equivalent to a carrier lifetime improvement of 5.7 and represents about a 19-fold reduction in the equivalent “Auger coefficient.”