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Electronic Devices and Semiconductor Manufacturing Commons™
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Full-Text Articles in Electronic Devices and Semiconductor Manufacturing
Physical Effects On The Worst-Case Delay Analysis And Signal Integrity Of Buses And Spirals, Mahmoud Mahany
Physical Effects On The Worst-Case Delay Analysis And Signal Integrity Of Buses And Spirals, Mahmoud Mahany
Theses and Dissertations
Physical effects have a significant impact on the IC design which will be investigated in this thesis. Moving toward advanced technology nodes, magnetic effects become more dominant than capacitive effects. As the dimensions of the devices go down and the interconnect manipulates the circuit behavior more and more. Cross talking and voltage drops are affecting the design heavily, however - going to the full electromagnetic point of view - current return path (CRP) adds significant parasitics to the performance of the chip. Neglecting the CRP gives wrong intuition and simulation of the designs, especially that the environment and surroundings can …
Machine Learning Applications To Static Timing Analysis, Waseem Mohamed Raslan
Machine Learning Applications To Static Timing Analysis, Waseem Mohamed Raslan
Theses and Dissertations
Modeling complex cell behavior is critical for accurate static timing analysis. Effective current source model, ECSM, and composite current source, CCS, waveform data compression became a necessity to reduce the size of technology files and increase the accuracy of the cell characterization data. We used deep learning nonlinear Autoencoders to compress voltage and current waveforms and compared them with singular value decomposition, SVD, approach. Autoencoders gave ~1.67x compression ratio for voltage waveforms better than SVD approach and gave 45x to 55x better compression ratio compared to other lossless techniques like bz2 and gzip. Autoencoders achieved ~1.7x compression ratio for complex …
Fault Modeling And Test Vector Generation For Asic Devices Exposed To Space Single Event Environment, Ahmed Mohamed
Fault Modeling And Test Vector Generation For Asic Devices Exposed To Space Single Event Environment, Ahmed Mohamed
Theses and Dissertations
This work aims at providing a concise automated flow to predict the effect of Single Event Transients (SETs) on ASIC chips by developing a method to characterize the circuit susceptibility to SET pulses propagation and then generation of the required input vectors that sensitize the victim paths. A new enhanced method for SET electrical propagation modeling is proposed and compared to a previously published analytical model. The method was applied on different standard cells libraries built over XFAB Xh018 technology and verified for accuracy against simulations. The new method showed enhancement in accuracy compared with previous work in literature. Industrial …