Chemical Engineering Commons^™

Multimode Quantitative Scanning Microwave Microscopy Of In Situ Grown Epitaxial Ba1-XSrXTio3 Composition Spreads, K. S. Chang, M. Aronova, O. Famodu, I. Takeuchi, S. E. Lofland, Jason R. Hattrick-Simpers, H. Chang

Faculty Publications

We have performed variable-temperature multimode quantitative microwavemicroscopy of in situepitaxial Ba_1−xSr_xTiO₃ thin-film composition spreads fabricated on (100) LaA₁O₃ substrates. Dielectric properties were mapped as a function of continuously varying composition from BaTiO₃ to SrTiO₃. We have demonstrated nondestructive temperature-dependent dielectric characterization of local thin-film regions. Measurements are simultaneously taken at multiple resonant frequencies of the microscope cavity. The multimode measurements allow frequency dispersion studies. We observe strong composition-dependent dielectric relaxation in Ba_1−xSr_xTiO₃ at microwave frequencies.