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Full-Text Articles in Physics
Negative Index Metamaterials Based On Metal-Dielectric Nanocomposites For Imaging Applications, L. Menon, W. T. Lu, A. L. Friedman, S. P. Bennett, D. Heiman, S. Sridhar
Negative Index Metamaterials Based On Metal-Dielectric Nanocomposites For Imaging Applications, L. Menon, W. T. Lu, A. L. Friedman, S. P. Bennett, D. Heiman, S. Sridhar
Srinivas Sridhar
Negative index metamaterials are demonstrated based on metal-dielectric nanocomposites prepared using a versatile bottom-up nanofabrication approach. The method involves the incorporation of vertically aligned metal nanowires such as Au and Ag inside dielectric aluminum oxide nanotemplates. Optical absorbance measurements show resonance peaks corresponding to the transverse and longitudinal surface plasmon modes. A quantitative model based on effective medium theory is in excellent agreement with experimental data, and points to specific composite configurations and wavelength regimes where such structures can have applications as negative refraction media for imaging.
Negative Index Metamaterials Based On Metal-Dielectric Nanocomposites For Imaging Applications, L. Menon, W. T. Lu, A. L. Friedman, S. P. Bennett, D. Heiman, S. Sridhar
Negative Index Metamaterials Based On Metal-Dielectric Nanocomposites For Imaging Applications, L. Menon, W. T. Lu, A. L. Friedman, S. P. Bennett, D. Heiman, S. Sridhar
Donald Heiman
Negative index metamaterials are demonstrated based on metal-dielectric nanocomposites prepared using a versatile bottom-up nanofabrication approach. The method involves the incorporation of vertically aligned metal nanowires such as Au and Ag inside dielectric aluminum oxide nanotemplates. Optical absorbance measurements show resonance peaks corresponding to the transverse and longitudinal surface plasmon modes. A quantitative model based on effective medium theory is in excellent agreement with experimental data, and points to specific composite configurations and wavelength regimes where such structures can have applications as negative refraction media for imaging.
Negative Index Metamaterials Based On Metal-Dielectric Nanocomposites For Imaging Applications, L. Menon, W. T. Lu, A. L. Friedman, S. P. Bennett, D. Heiman, S. Sridhar
Negative Index Metamaterials Based On Metal-Dielectric Nanocomposites For Imaging Applications, L. Menon, W. T. Lu, A. L. Friedman, S. P. Bennett, D. Heiman, S. Sridhar
Latika Menon
Negative index metamaterials are demonstrated based on metal-dielectric nanocomposites prepared using a versatile bottom-up nanofabrication approach. The method involves the incorporation of vertically aligned metal nanowires such as Au and Ag inside dielectric aluminum oxide nanotemplates. Optical absorbance measurements show resonance peaks corresponding to the transverse and longitudinal surface plasmon modes. A quantitative model based on effective medium theory is in excellent agreement with experimental data, and points to specific composite configurations and wavelength regimes where such structures can have applications as negative refraction media for imaging.
Optical Detection Of Melting Point Depression For Silver Nanoparticles Via In Situ Real Time Spectroscopic Ellipsometry, S. A. Little, T. Begou, R. W. Collins, S. Marsillac
Optical Detection Of Melting Point Depression For Silver Nanoparticles Via In Situ Real Time Spectroscopic Ellipsometry, S. A. Little, T. Begou, R. W. Collins, S. Marsillac
Electrical & Computer Engineering Faculty Publications
Silver nanoparticle films were deposited by sputtering at room temperature and were annealed while monitoring by real time spectroscopic ellipsometry (SE). The nanoparticle dielectric functions (0.75 eV-6.5 eV) obtained by SE were modeled using Lorentz and generalized oscillators for the nanoparticle plasmon polariton (NPP) and interband transitions, respectively. The nanoparticle melting point could be identified from variations in the oscillator parameters during annealing, and this identification was further confirmed after cooling through significant, irreversible changes in these parameters relative to the as-deposited film. The variation in melting point with physical thickness, and thus average nanoparticle diameter, as measured by SE …
Growth Analysis Of (Ag,Cu)Inse2 Thin Films Via Real Time Spectroscopic Ellipsometry, S. A. Little, V. Ranjan, R. W. Collins, S. Marsillac
Growth Analysis Of (Ag,Cu)Inse2 Thin Films Via Real Time Spectroscopic Ellipsometry, S. A. Little, V. Ranjan, R. W. Collins, S. Marsillac
Electrical & Computer Engineering Faculty Publications
In situ and ex situ characterization methods have been applied to investigate the properties of (Ag,Cu)InSe2 (ACIS) thin films. Data acquired from real time spectroscopic ellipsometry (RTSE) experiments were analyzed to extract the evolution of the nucleating, bulk, and surface roughness layer thicknesses. The evolution of these layer thicknesses suggests a transition from Volmer-Weber to Stranski-Krastanov type behavior when Cu is replaced by Ag. The complex dielectric functions of ACIS at both deposition and room temperature as a function of film composition were also extracted from the RTSE data, enabling parameterization of the alloy optical properties.