Physics Commons^™

Hoe-Based Espi Systems, Emilia Mihaylova, Viswanath Bavigadda, Raghavendra Jallapuram, Vincent Toal

Conference Papers

Electronic speckle pattern interferometry (ESPI) is a full-field measurement technique, capable of displaying vibrational mode shapes. Two electronic speckle pattern interferometers using reflection holographic optical elements (RHOEs) are presented. In the first ESPI system the RHOE is designed to create the speckled reference beam. A partially reflective glass plate provides illumination of the object along the normal to its surface, ensuring that the system is sensitive only to out-of-plane displacement of the object. It is demonstrated that the HOE-based system can be used for vibration measurements. Phase shifting can be implemented for fringe analysis. In the second ESPI system a …