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Local Structural Determination In Strained-Layer Semiconductors, Joseph Woicik
Local Structural Determination In Strained-Layer Semiconductors, Joseph Woicik
Sustainability Seminar Series
The theory of elasticity accurately describes the deformations of macroscopic bodies under the action of applied stress. In this lecture I will examine the internal mechanisms of elasticity for strained-layer semiconductor heterostructures. In particular, I will present extended x-ray absorption fine structure (EXAFS) and x-ray diffraction (XRD) measurements to show how bond lengths and bond angles change with strain and compare with various theoretical models. These synchrotron-based experimental techniques and their application to thin films will be developed in detail.