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Full-Text Articles in Physics
Division-Of-Wave-Front Thin-Film Beam Splitter For Generating Binary Patterns Of Orthogonal Elliptical Polarization States, R. M.A. Azzam
Division-Of-Wave-Front Thin-Film Beam Splitter For Generating Binary Patterns Of Orthogonal Elliptical Polarization States, R. M.A. Azzam
Electrical Engineering Faculty Publications
A division-of-wave-front thin-film beam splitter is described that reflects monochromatic light at oblique incidence with orthogonal elliptical polarization states. It consists of a metallic substrate partially covered with a transparent thin film that inverts the ratio ρ of the complex p and s reflection coefficients at the principal angle of the metal. Any pattern of coated and uncoated areas of the substrate is imprinted upon the reflected wave front as a corresponding two-dimensional spatial binary polarization pattern. A specific design is given that uses a Au substrate at a wavelength of 632.8 nm. The effects of small errors in the …
Thin-Film Devices For Polarized Light- Introduction, R. M.A. Azzam, William H. Southwell
Thin-Film Devices For Polarized Light- Introduction, R. M.A. Azzam, William H. Southwell
Electrical Engineering Faculty Publications
No abstract provided.
Extrema Of The Magnitude And The Phase Of A Complex Function Of A Real Variable: Application To Attenuated Internal Reflection, R. M.A. Azzam
Extrema Of The Magnitude And The Phase Of A Complex Function Of A Real Variable: Application To Attenuated Internal Reflection, R. M.A. Azzam
Electrical Engineering Faculty Publications
Given a complex function F(ω) = |F(ω)|exp[jΔ(ω)] of a real argument ω, the extrema of its magnitude |F(ω)| and its phase Δ(ω), as functions of ω, are determined simultaneously by finding the roots of one common equation, Im[G(ω)] = 0, where G= (F′/F)2 and F′ = ∂F/∂ω. The extrema of |F| and Δ are associated with Re G < 0 and Re G > 0, respectively. This easy-to-prove theorem has a wide range of applications in physical optics. We consider attenuated internal reflection (AIR) as …
The Relationship Of Pore Volume And Pore Size Distribution To The Development Of Gloss And Scattering Coefficient, John A. Cook
The Relationship Of Pore Volume And Pore Size Distribution To The Development Of Gloss And Scattering Coefficient, John A. Cook
Masters Theses
This study describes in a quantitative manner the relationships between coating structure and optical properties. Gloss, scattering coefficient and void volume were measured after applying different blends of polystyrene spheres to mylar film. Each coating was modeled using large spherical particles of the same size ratios to measure pore size distribution. The coating structure followed well with theoretical packing characteristics of spheres. Optical properties were related to changes in coating structure. Scattering coefficient and gloss correlated better with pore size distribution than particle size. Gloss increased when total void volume was reduced, while the scattering coefficient decreased.
General Analysis And Optimization Of The Four-Detector Photopolarimeter, R. M.A. Azzam, I. M. Elminyawi, A. M. El-Saba
General Analysis And Optimization Of The Four-Detector Photopolarimeter, R. M.A. Azzam, I. M. Elminyawi, A. M. El-Saba
Electrical Engineering Faculty Publications
The four-detector photopolarimeter (FDP) is analyzed for an arbitrary spatial configuration and any reflection characteristics (ri, ψi, Δi) of the first three detectors. The instrument matrix A, which relates the output signal vector I to the input Stokes vector S by I = AS, and its determinant are derived explicitly. The essential condition that A be nonsingular (det A ≠ 0) is satisfied in general with uncoated absorbing detector surfaces, assuming that the plane of incidence (POI) is rotated between successive reflections by other than 90°. Therefore no special coatings on …
Modal Interference Techniques For Strain Detection In Few-Mode Optical Fibers, Bradley D. Duncan
Modal Interference Techniques For Strain Detection In Few-Mode Optical Fibers, Bradley D. Duncan
Electro-Optics and Photonics Faculty Publications
Interference between the modes of an optical fiber results in specific intensity patterns which can be modulated as a function of disturbances in the optical fiber system. These modulation effects are a direct result of the difference in propagation constants of the constituent modes. In this presentation it is shown how the modulated intensity patterns created by the interference of specific mode groups in few-mode optical fibers (V < 5.0) can be used to detect strain. A detailed discussion of the modal phenomena responsible for the observed strain induced pattern modulation is given and it is shown that strain detection sensitivities on the order of 10-9 can be expected. Data taken during the evaluation of an actual experimental strain detection system based on the developed theory is also presented.