Physics Commons^™

Phase Shifts In Frustrated Total Internal Reflection And Optical Tunneling By An Embedded Low-Index Thin Film, R. M.A. Azzam

Electrical Engineering Faculty Publications

Simple and explicit expressions for the phase shifts that p- and s-polarized light experience in frustrated total internal reflection (FTIR) and optical tunneling by an embedded low-index thin film are obtained. The differential phase shifts in reflection and transmission Δr,Δt are found to be identical, and the associated ellipsometric parameters ψr,ψt are governed by a simple relation, independent of film thickness. When the Fresnel interface reflection phase shifts for the pand s polarizations or their average are quarter-wave, the corresponding overall reflection phase shifts introduced by the embedded layer are also quarter-wave for all values of film …