Other Mathematics Commons^™

Defect Detection In Atomic Resolution Transmission Electron Microscopy Images Using Machine Learning, Philip Cho, Aihua W. Wood, Krishnamurthy Mahalingam, Kurt Eyink

Faculty Publications

Point defects play a fundamental role in the discovery of new materials due to their strong influence on material properties and behavior. At present, imaging techniques based on transmission electron microscopy (TEM) are widely employed for characterizing point defects in materials. However, current methods for defect detection predominantly involve visual inspection of TEM images, which is laborious and poses difficulties in materials where defect related contrast is weak or ambiguous. Recent efforts to develop machine learning methods for the detection of point defects in TEM images have focused on supervised methods that require labeled training data that is generated via …