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Full-Text Articles in Physical Sciences and Mathematics

Precision E- Beam Polarimetry At An E-E+ B Factory Using Tau-Pair Events, J. P. Lees, V. Poireau, V, Tisserand, E. Grauges, A. Palano, G. Eigen, D. N. Brown, Yu. G. Kolomensky, M. Fritsch, H. Koch, R. Cheaib, C. Hearty, T. S. Mattison, J. A. Mckenna, R. Y. So, V. E. Blinov, A. R. Buzykaev, V. P. Druzhinin, Milind Purohit, Et. Al. Sep 2023

Precision E- Beam Polarimetry At An E-E+ B Factory Using Tau-Pair Events, J. P. Lees, V. Poireau, V, Tisserand, E. Grauges, A. Palano, G. Eigen, D. N. Brown, Yu. G. Kolomensky, M. Fritsch, H. Koch, R. Cheaib, C. Hearty, T. S. Mattison, J. A. Mckenna, R. Y. So, V. E. Blinov, A. R. Buzykaev, V. P. Druzhinin, Milind Purohit, Et. Al.

Faculty Publications

We present a new technique, “tau polarimetry,” for measuring the longitudinal beam polarization present in an e+e collider through the analysis of e+e → τ+τ events. By exploiting the sensitivity of τ decay kinematics to the longitudinal polarization of the beams, we demonstrate that the longitudinal polarization can be measured with a 3 per mil systematic uncertainty at the interaction point using a technique that is independent of spin and beam transport modeling. Using 424.2 ± 1.8 fb−1 of BABAR data at √ s = 10.58 GeV, the average longitudinal …


Shaping The Far-Zone Intensity, Degree Of Polarization, Angle Of Polarization, And Ellipticity Angle Using Vector Schell-Model Sources, Milo W. Hyde Iv Mar 2019

Shaping The Far-Zone Intensity, Degree Of Polarization, Angle Of Polarization, And Ellipticity Angle Using Vector Schell-Model Sources, Milo W. Hyde Iv

Faculty Publications

This paper presents a method to control both the shape and polarization of a beam in the far field using a vector Schell-model source. Given a desired far-zone beam shape and polarization, and applying Fourier and statistical optics theory, we derive the requisite second-order moments of said source, discuss what aspects of the far-zone beam can be controlled, and develop a step-by-step procedure for synthesizing the required random vector field instances. We validate this approach with Monte-Carlo wave-optics simulations. The results are found to be in very good agreement with the desired far-zone beam characteristics. The beam-shaping technique developed in …


Characterization Of Optical Constants For Uranium From 10 To 47 Nm, Nicole Brimhall, Nicholas Herrick, David D. Allred, R. Steven Turley, Michael Ware, Justin Peatross Mar 2010

Characterization Of Optical Constants For Uranium From 10 To 47 Nm, Nicole Brimhall, Nicholas Herrick, David D. Allred, R. Steven Turley, Michael Ware, Justin Peatross

Faculty Publications

We use a laser high-harmonics-based extreme-ultraviolet (EUV) polarimeter to determine the optical constants of elemental uranium in the wavelength range from 10 to 47 nm. The constants are extracted from the measure ratio of p-polarized to s-polarized reflectance from a thin uranium film deposited in situ. The film thickness is inferred from a spectroscopic ellipsometry measurement of the sample after complete oxidation in room air. Uranium has been used as a high-reflectance material in the EUV. However, difficulties with oxidation prevented its careful characterization previous to this study. We find that measured optical constants for uranium vary significantly from previous …


Far-Field Optical Nanoscopy Based On Continuous Wave Laser Stimulated Emission Depletion, C. Kuang, Wei Zhao, Guiren Wang Jan 2010

Far-Field Optical Nanoscopy Based On Continuous Wave Laser Stimulated Emission Depletion, C. Kuang, Wei Zhao, Guiren Wang

Faculty Publications

Stimulated emission depletion (STED) microscopy is one of the breakthrough technologies that belong to far-field optical microscopy and can achieve nanoscale spatial resolution. We demonstrate a far-field optical nanoscopy based on continuous wave lasers with different wavelengths, i.e., violet and green lasers for excitation and STED, respectively. Fluorescent dyes Coumarin 102 and Atto 390 are used for validating the depletion efficiency. Fluorescent nanoparticles are selected for characterizing the spatial resolution of the STED system. Linear scanning of the laser beams of the STED system along one line of a microscope slide, which is coated with the nanoparticles, indicates that a …


Microsecond Spin-Flip Times In N-Gaas Measured By Time-Resolved Polarization Of Photoluminescence, John S. Colton, T. A. Kennedy, A. S. Bracker, D. Gammon Mar 2004

Microsecond Spin-Flip Times In N-Gaas Measured By Time-Resolved Polarization Of Photoluminescence, John S. Colton, T. A. Kennedy, A. S. Bracker, D. Gammon

Faculty Publications

We have observed microsecond spin-flip times in lightly doped n-GaAs, by measuring the photoluminescence polarization in the time domain with pump and probe pulses. Times up to 1.4 μs have been measured. Our results as a function of magnetic field indicated three regions governing the spin relaxation: a low field region, where spin-flip times increase due to suppression of the nuclear hyperfine interaction for localized electrons, a medium field region where spin-flip times increase due to narrowing of the hyperfine relaxation for interacting electrons, and a high field region where spin-flip times begin to level off due to the increasing …