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Articles 31 - 33 of 33
Full-Text Articles in Physical Sciences and Mathematics
Characterization Of Metal/Carbon Multilayers By Raman Spectroscopy, David D. Allred, Qi Wang, Jesus González-Hernández
Characterization Of Metal/Carbon Multilayers By Raman Spectroscopy, David D. Allred, Qi Wang, Jesus González-Hernández
Faculty Publications
Laser Raman spectroscopy has been found to be useful for characterizing amorphous semiconductor multilayers, especially the interfaces of multilayers. Recently, we have extended this technique to the characterization of magnetron sputtered multilayers commonly used as reflectors in soft x-ray optics. Unlike the multilayers previously studied which contained only semiconductors and dielectrics, these are generally semiconductor/metal multilayers. We report here on the Raman characterization of the most common class of multilayers used in soft x-ray optics, those that contain a high density metal like tungsten interspersed with layers of carbon. In all of the metal/carbon multilayers the dominate feature in the …
Deposition Of Zinc Selenide By Atomic Layer Epitaxy For Multilayer X-Ray Optics, J.K. Shurtleff, David D. Allred, R. T. Perkins, J. M. Thorne
Deposition Of Zinc Selenide By Atomic Layer Epitaxy For Multilayer X-Ray Optics, J.K. Shurtleff, David D. Allred, R. T. Perkins, J. M. Thorne
Faculty Publications
Thin film deposition techniques currently being used to produce multilayer x-ray optics (MXOs) have difficulty producing smooth, uniform multilayers with d-spacings less than about twelve angstroms. We are investigating atomic layer epitaxy (ALE) as an alternative to these techniques. ALE is a chemical vapor deposition technique which deposits an atomic layer of material during each cycle of the deposition process. The thickness of a film deposited by ALE depends only on the number of cycles. Multilayers deposited by ALE should be smooth and uniform with precise d-spacings which makes ALE an excellent technique for producing multilayer x-ray optics. We have …
Design Of High Performance Soft X-Ray Windows, Raymond T. Perkins, David D. Allred, Larry V. Knight, James M. Thorne
Design Of High Performance Soft X-Ray Windows, Raymond T. Perkins, David D. Allred, Larry V. Knight, James M. Thorne
Faculty Publications
X-ray windows are used in sources and detectors to separate the neighborhood of the x-ray generation or detection from the use environment. While each use has its own requirements, there are some principles that should be used in designing an optimal x-ray window. Because x-rays are absorbed to some extent by all materials, minimizing absorption is one criterion in preparing windows. Also, for most uses there is a pressure difference across the window so that ensuring pinhole-free structure and sufficient mechanical strength to support the differential is another criterion for window design. Traditionally, absorption is minimized by fabricating the window …