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Full-Text Articles in Physical Sciences and Mathematics
Secondary Electron Yield Measurements Of Carbon Nanotube Forests: Dependence On Morphology And Substrate, Brian Wood, Jordan Lee, Gregory Wilson, T. -C. Shen, Jr Dennison
Secondary Electron Yield Measurements Of Carbon Nanotube Forests: Dependence On Morphology And Substrate, Brian Wood, Jordan Lee, Gregory Wilson, T. -C. Shen, Jr Dennison
Journal Articles
Total, secondary, and backscatter electron yield data were taken with beam energies between 15 eV and 30 keV, in conjunction with energy emission data, to determine the extent of suppression of yield caused by carbon nanotube (CNT) forest coatings on substrates. CNT forests can potentially lower substrate yield due to both its inherently low-yield, low-atomic number (Z) carbon composition, and its bundled, high-aspect ratio structure. Rough surfaces, and in particular, surfaces with deep high-aspect-ratio voids, can suppress yields, as the electrons emitted from lower lying surfaces are recaptured by surface protrusions rather than escaping the near-surface region. Yields of multilayered …
Measuring The Double Layer Capacitance Of Electrolyte Solutions Using A Graphene Field Effect Transistor, Agatha Ulibarri
Measuring The Double Layer Capacitance Of Electrolyte Solutions Using A Graphene Field Effect Transistor, Agatha Ulibarri
Senior Theses
When operating graphene field effect transistors (GFETs) in fluid, a double layer capacitance (Cdl) is formed at the surface. In the literature, the Cdl is estimated using values obtained using metal electrode experiments. Due to the distinctive electronic and surface properties of graphene, there is reason to believe these estimates are inadequate. This work seeks to directly characterize the double layer capacitance of a GFET. A unique method for determining the Cdl has been implemented, and data has been obtained for three electrolytes and one ionic fluid. The results yield dramatically lower Cdl values than …