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Diagnosis Of Multiple Scan-Chain Faults In The Presence Of System Logic Defects, Zhen Chen, Sharad C. Seth, Dong Xiang, Bhargab B. Bhattacharya

CSE Conference and Workshop Papers

We present a combined hardware-software based approach to scan-chain diagnosis, when the outcome of a test may be affected by system faults occurring in the logic outside of the scan chain. For the hardware component we adopt the double-tree scan (DTS) chain architecture, which has previously been shown to be effective in reducing power, volume, and application time of tests for stuck-at and delay faults. We develop a version of flush test which can resolve a multiple fault in a DTS chain to a small number of suspect candidates. Further resolution to a unique multiple fault is enabled by the …