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Reliability

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High Temperature Degradation In Gan-Based Hall Effect Sensors, Alexis Anne Krone Jul 2021

High Temperature Degradation In Gan-Based Hall Effect Sensors, Alexis Anne Krone

Graduate Theses and Dissertations

This research focuses on understanding the effects of accelerated aging through temperature and environment on novel gallium nitride-based Hall effect magnetic field sensors and determining device reliability under electric vehicle operating conditions. The device reliability was modeled using accelerated aging for the temperatures of 200 °C, 350 °C, 450 °C, and 600 °C under various time steps unique to each temperature and either air, which is identical to operating circumstances, or argon, which would model the hermetic packaging environment. Using a high temperature furnace and oven, devices underwent high temperature storage tests at a chosen temperature and time step. Afterwards, …