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Focused Beam System Biaxial Material Characterization, Nicholas A. O'Gorman
Focused Beam System Biaxial Material Characterization, Nicholas A. O'Gorman
Theses and Dissertations
Electromagnetic material characterization is the process of determining the constitutive parameters (complex permittivity and permeability) of given a sample. Due to the large number of unknowns involved, multiple unique measurements are required for material property extraction. Many measurement methods, such as waveguides and striplines, possess a rigid internal structure that the sample being measured must adhere to. This rigidity limits these methods to samples that fit within the device and inhibits oblique sample orientations, limiting the number of independent measurements that can be obtained. A focus beam system, due to being an open system with greater freedom in sample size …