Power and Energy Commons^™

In-Situ Ellipsometry Characterization Of Anodically Grown Silicon Dioxide And Lithium Intercalation Into Silicon, Eric A. Montgomery

Department of Electrical and Computer Engineering: Dissertations, Theses, and Student Research

In this thesis, in-situ ellipsometry and electroanalytical investigations of two electrochemical processes are reported: including the formation of anodically grown silicon dioxide and the intercalation of lithium into silicon. Analysis of the ellipsometry data shows that the anodically grown silicon dioxide layer is uniform and has similar properties as thermally grown silicon dioxide. The lithium-ion intercalation data reveals non-uniform thin film formation, which requires further studies and development of appropriate ellipsometric optical models.

Advisers: Eva Schubert and Mathias Schubert

A Compact Physical Model For Morphology Induced Intrinsic Degradation Of Polymer Based Bulk Heterojunction Solar Cell, Biswajit Ray, Muhammad A. Alam

Birck and NCN Publications

The gradual loss of efficiency during field operation poses a fundamental challenge for economic viability of any solar cell technology. Well known examples include light-induced degradation in Si-based cell (Staebler-Wronski effect), Cu diffusion in thin film (CIGS) cell, hot-spot degradation in series connected modules, etc. Here we develop a compact model for an intrinsic degradation concern for bulk heterojunction type organic photovoltaic (BH-OPV) cells that involve continued (thermal) phase segregation of the donor-acceptor molecules leading to characteristic loss of efficiency and performance. Our approach interprets a number of BH-OPV device degradation measurements within a common framework and suggests/rationalizes intuitive routes …