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Electrical and Computer Engineering Commons™
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Articles 1 - 4 of 4
Full-Text Articles in Electrical and Computer Engineering
Subharmonic Generation By Resonant Three‐Wave Interaction Of Deep‐Water Capillary Waves, Partha P. Banerjee, Adrianus Korpel
Subharmonic Generation By Resonant Three‐Wave Interaction Of Deep‐Water Capillary Waves, Partha P. Banerjee, Adrianus Korpel
Electrical and Computer Engineering Faculty Publications
Subharmonic generation has been observed during the propagation of deep‐water capillary waves. The observations are shown to be in agreement with the theory of degenerate resonant noncollinear three‐wave interaction in a nonlinear, dispersive medium.
Polarization-Preserving Single-Layer-Coated Beam Displacers And Axicons, R. M.A. Azzam, M. Emdadur Rahman Khan
Polarization-Preserving Single-Layer-Coated Beam Displacers And Axicons, R. M.A. Azzam, M. Emdadur Rahman Khan
Electrical Engineering Faculty Publications
A design procedure is described to determine the thicknesses of single-layer coatings of a given dielectric on a given metallic substrate so that any input polarization of light is preserved after two reflections at the same angle of incidence from a parallel-mirror beam displacer or an axicon. This is achieved by equalizing the net complex p and s reflection coefficients (also called the radial and azimuthal eigenvalues of an axicon) after two reflections. The net polarization-independent reflectance (insertion loss) of the device is computed and found to exceed the net minimum parallel reflectance of the uncoated device for incidence above …
Scheme To Polarization-Correct A Waxicon, R. M.A. Azzam
Scheme To Polarization-Correct A Waxicon, R. M.A. Azzam
Electrical Engineering Faculty Publications
No abstract provided.
Constant-Psi Constant-Delta Contour Maps: Applications To Ellipsometry And To Reflection-Type Optical Devices, A.-R. M. Zaghloul, R. M.A. Azzam
Constant-Psi Constant-Delta Contour Maps: Applications To Ellipsometry And To Reflection-Type Optical Devices, A.-R. M. Zaghloul, R. M.A. Azzam
Electrical Engineering Faculty Publications
Constant-psi constant-delta contour maps in the reduced angle-of-incidence-film-thickness plane that are useful in ellipsometry and in design of reflection-type optical devices are discussed. As a specific example, a contour map is given for the SiO2-Si film-substrate system at the 6328-Å He-Ne laser wavelength.