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Full-Text Articles in Engineering
Benefits Of Considering More Than Temperature Acceleration For Gan Hemt Life Testing, Ronald A. Coutu Jr., Robert A. Lake, Bradley D. Christiansen, Eric R. Heller, Christopher A. Bozada, Brian S. Poling, Glen D. Via, James P. Theimer, Stephen E. Tetlak, Ramakrishna Vetury, Jeffrey B. Shealy
Benefits Of Considering More Than Temperature Acceleration For Gan Hemt Life Testing, Ronald A. Coutu Jr., Robert A. Lake, Bradley D. Christiansen, Eric R. Heller, Christopher A. Bozada, Brian S. Poling, Glen D. Via, James P. Theimer, Stephen E. Tetlak, Ramakrishna Vetury, Jeffrey B. Shealy
Faculty Publications
The purpose of this work was to investigate the validity of Arrhenius accelerated-life testing when applied to gallium nitride (GaN) high electron mobility transistors (HEMT) lifetime assessments, where the standard assumption is that only critical stressor is temperature, which is derived from operating power, device channel-case, thermal resistance, and baseplate temperature. We found that power or temperature alone could not explain difference in observed degradation, and that accelerated life tests employed by industry can benefit by considering the impact of accelerating factors besides temperature. Specifically, we found that the voltage used to reach a desired power dissipation is important, and …
Correlation Of Fault-Injection To Proton Accelerator Persistent Cross Section Measurements, Keith S. Morgan, Michael J. Wirthlin
Correlation Of Fault-Injection To Proton Accelerator Persistent Cross Section Measurements, Keith S. Morgan, Michael J. Wirthlin
Faculty Publications
Sponsorship: Los Alamos National Laboratory. Field Programmable Gate Arrays (FPGAs) are an attractive solution for space system electronics. Unfortunately, FPGAs are susceptible to radiation-induced single-event upsets (SEU). As such, the FPGA Reliability Studies research group (http://reliability.ee.byu.edu) at Brigham Young University has studied ways to effectively measure the static, dynamic and persistent cross sections of an FPGA desgin; each of which are characterized in some way by how the part reacts to an SEU. One such method is to actually radiate an FPGA and monitor how it reacts to SEUs. A cheaper, more efficient solution is to use fault-injection to emulate …