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Electrical and Computer Engineering

California Polytechnic State University, San Luis Obispo

Theses/Dissertations

2010

CMOS

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Design Techniques To Improve Time Dependent Dielectric Breakdown Based Failure For Cmos Circuits, Emanuel S. Tarog Jan 2010

Design Techniques To Improve Time Dependent Dielectric Breakdown Based Failure For Cmos Circuits, Emanuel S. Tarog

Master's Theses

This project investigates the failure of various CMOS circuits as a result of Time Dependent Dielectric Breakdown (TDDB) and explores design techniques to increase the mean time to failure (MTTF) of large-scale circuits. Time Dependent Dielectric Breakdown is a phenomenon where the oxide underneath the gate degrades as a result of the electric field in the material. Currently, there are few well documented design techniques that can increase lifetime, but with a tool chain I created called the MTTF Analyzing Program, or MAP, I was able to test circuits under various conditions in order to identify weak links, discover relationships, …

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