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Crop-Tree Thinning A 50-Year-Old Western Larch Stand: 25-Year Results, United States Department Of Agriculture, Forest Service Jan 1984

Crop-Tree Thinning A 50-Year-Old Western Larch Stand: 25-Year Results, United States Department Of Agriculture, Forest Service

Forestry

This paper describes study results after 25 years of crop-tree thinning in a western larch (Larix occidentalis Nutt.) pole stand in western Montana. Five 1/2-acre plots were established in the Petty Creek drainage, Lolo National Forest, at an elevation of 4,200 feet above sea level. Western larch site index of the study area was 52 feet at 50 years. The stand was 50 years old when the study began in 1949. Two plots were thinned by the D+4 Rule, two by the Crown Rule, and one was left unthinned as a control. After 25 years, periodic diameter, basal area, and …


The Sleeping Child Burn - 21 Years Of Postfire Change, United States Department Of Agriculture, Forest Service Jan 1984

The Sleeping Child Burn - 21 Years Of Postfire Change, United States Department Of Agriculture, Forest Service

Forestry

In early August 1961, more than 26,000 acres (10,500 ha) of upper montane and subalpine forest on the Bitterroot National Forest burned in a lightning-caused wildfire. At the time, the Sleeping Child Burn represented the single largest forest fire in the Northern Rocky Mountains in more than 20 years. Historically, large wildfires have not been uncommon in this region: but after two decades of successful forest fire suppression, the Sleeping Child was treated as an event almost without precedent. Not only was reseeding and rehabilitation an immediate concern, a substantial effort was invested in attempting to return the burned area …


Tree Diameter Measurements At English And Metric Standard Heights: A Comparison, United States Department Of Agriculture, Forest Service Jan 1984

Tree Diameter Measurements At English And Metric Standard Heights: A Comparison, United States Department Of Agriculture, Forest Service

Forestry

The impact of measuring trees at 1.3 m versus 1.37 m heights above ground line was analyzed. The results indicate that the difference in diameter measurement taken at the two points averages around 1 percent. An equation for converting from English diameter at breast height to the metric equivalent of 1.3 m is presented.


Effect Of Small Aspen Clearcuts On Water Yield And Water Quality, United States Department Of Agriculture, Forest Service Jan 1984

Effect Of Small Aspen Clearcuts On Water Yield And Water Quality, United States Department Of Agriculture, Forest Service

Forestry

Streamflow and water quality were monitored in a paired watershed study involving the removal of 20 percent of the aspen (on 13 percent of the area) in five small clearcuts from a 217-acre (88-ha) catchment. There were no significant changes in peak flow, timing, or annual yield during the 4 years of posttreatment monitoring. Significant changes in pH, calcium, magnesium, and nitrates in the snowmelt streamflow from ephemeral subdrainages occurred the second year after cutting. At least some of the differences were attributed to the chemistry of the 1976-77 snowfall, which was also significantly different from snow sampled in the …


Development Of Structured Regression Hypotheses Interactive/Descriptive Geometry Through Five Dimensions, United States Department Of Agriculture, Forest Service Jan 1984

Development Of Structured Regression Hypotheses Interactive/Descriptive Geometry Through Five Dimensions, United States Department Of Agriculture, Forest Service

Miscellaney

Regression hypotheses admitted to statistical evaluation should, of course, be germain to relations between the variables considered. This constraint is easily violated with the screening of arbitrarily adopted sets of hypotheses. Sequential polynomials in additive models, for example, may include components that are not commensurate with expectation (prior knowledge) and may not include those that are (e.g., unique interaction terms) and, since the analytical results from the screening of meaningless hypotheses may themselves be meaningless, there is substantial incentive for serious preanalysis consideration of the hypotheses to be evaluated.


The Polar Ionosphere: Editorial, Vincent B. Wickwar, J W. Meriwether Jr. Jan 1984

The Polar Ionosphere: Editorial, Vincent B. Wickwar, J W. Meriwether Jr.

All Physics Faculty Publications

Editorial


On The Reversal From “Sunward” To “Antisunward” Plasma Convection In The Dayside High Latitude Ionosphere, T S. Jorgensen, E Friis-Christensen, Vincent B. Wickwar, J D. Kelly, C R. Clauer, P M. Banks Jan 1984

On The Reversal From “Sunward” To “Antisunward” Plasma Convection In The Dayside High Latitude Ionosphere, T S. Jorgensen, E Friis-Christensen, Vincent B. Wickwar, J D. Kelly, C R. Clauer, P M. Banks

All Physics Faculty Publications

Preliminary observations of dayside high latitude ionospheric plasma convection with the Sondrestrom incoherent‐scatter radar indicate that plasma can be observed to enter the polar cap region through rotational reversals at most local times between dawn and dusk and not just in a narrow region around noon. Assuming that rotational reversals are signatures of a solar wind‐magnetosphere interaction which drives magnetospheric convection, the observations indicate that this interaction occurs over a longitudinally wide area of the dayside magnetosphere. The observations also show that the distribution of F‐region plasma in the polar cap is dependent on ionization sources anywhere between dawn and …


Electrostatic And Magnetic Imaging Without Image Rotation, Zhou Li-Wei, Ni Guo-Qiang, Fang Er-Lun Jan 1984

Electrostatic And Magnetic Imaging Without Image Rotation, Zhou Li-Wei, Ni Guo-Qiang, Fang Er-Lun

Scanning Electron Microscopy

A method is discussed for designing electrostatic and magnetic imaging systems without image rotation. Tsukkerman's condition for an imaging system free of rotation does not appear to be applicable to practical designs. We have modified his theory to obtain two other conditions for the normalized axial electric potential V(z), the normalized axial magnetic induction G(z), and a lens strength parameter 𝞴 which can be interpreted as an eigen-value. Some analytical examples and numerical results are given.


The Influence Of Sample And Detector Angles Upon Auger Electron Signal, Robert L. Gerlach Jan 1984

The Influence Of Sample And Detector Angles Upon Auger Electron Signal, Robert L. Gerlach

Scanning Electron Microscopy

The effects of the sample to incident electron beam angle and of the detector. angle on the Auger electron signal are important for quantitative Auger analysis, particularly for Auger mapping and line scans. A first approximation, single scattering, mean free path model is employed to simulate the Auger signal resulting from a range of sample and detector angles. The model is single scattering in the sense that the excitation path is taken to be a straight line into the solid. A second model approximates multiple scattering by a normal distribution of ionizing flux angles about the incident beam direction.

Since …


Various Attempts To Reduce The Dimensions Of Magnetic Electron Lenses Used For High Voltage Microscopes, J. L. Balladore, R. Murillo, J. Trinquier Jan 1984

Various Attempts To Reduce The Dimensions Of Magnetic Electron Lenses Used For High Voltage Microscopes, J. L. Balladore, R. Murillo, J. Trinquier

Scanning Electron Microscopy

Magnetic fields are used in electron microscopy for a variety of purposes: image formation, energy analysis and correction of astigmatism, for example.

We are interested in the problems of designing short focal length lenses to be used for focusing high energy electrons in the energy range 1-3 MeV.

These lenses are generally very large and we have tried to reduce their dimensions to simplify their construction and use. From this point of view, it is necessary to diminish the magnetic coil and the magnetic circuit iron.

Several solutions have been proposed in the case of the coil. We have obtained …


A Comparison Of Lanthanum Hexaboride, Cold Field Emission And Thermal Field Emission Electron Guns For Low Voltage Scanning Electron Microscopy, J. Orloff Jan 1984

A Comparison Of Lanthanum Hexaboride, Cold Field Emission And Thermal Field Emission Electron Guns For Low Voltage Scanning Electron Microscopy, J. Orloff

Scanning Electron Microscopy

A comparison of lanthanum hexaboride, cold W(310) field emission and Zr/W thermal field emission cathodes was made by calculating the current-spot size relationship for each, using comparable lenses, to determine which would be suitable for high current operation at 1 keV beam energy, with a focused beam diameter < 0.05 μm. On the criteria of highest current, reasonable operating conditions for the gun for low noise operation and long term cathode stability it was found that the lanthanum hexaboride and cold field emission cathodes are inadequate or marginal and that the best performance is obtainable from the thermal field emission cathode.


Electron Detectors Used For Imaging In The Scanning Electron Microscope, V. N. E. Robinson Jan 1984

Electron Detectors Used For Imaging In The Scanning Electron Microscope, V. N. E. Robinson

Scanning Electron Microscopy

Electron detectors used for imaging in the scanning electron microscope include those which detect secondary electrons, various portions of the backscattered electron signal, and the residual specimen current. The use of a different detector will often produce a different image of the same specimen. The information contained in these images depends upon the signal detected and the properties of the detector used. The choice of detector to be used depends upon the information desired.


Low Voltage Scanning Electron Microscopy, James B. Pawley Jan 1984

Low Voltage Scanning Electron Microscopy, James B. Pawley

Scanning Electron Microscopy

The scanning electron microscope (SEM) usually operates with a beam voltage, V0, in the range of 10-30 kV, even though many early workers suggested the use of lower voltages to increase topographic contrast and to reduce specimen charging and beam damage. The chief reason for this contradiction is low instrumental performance when V0 = 1-3 kV. The problems include low source brightness, greater defocussing due to chromatic aberration, greater sensitivity to internal and external stray fields and difficulty in collecting the secondary electron signal without defocussing the probe. Recently considerable efforts have been made to overcome these …


Determination Of Optical Properties Of A Field Emission Gun Coupled With A Linear Accelerator For High Voltage Microscopy, M. Denizart, S. Roques, F. Sonier, B. Jouffrey Jan 1984

Determination Of Optical Properties Of A Field Emission Gun Coupled With A Linear Accelerator For High Voltage Microscopy, M. Denizart, S. Roques, F. Sonier, B. Jouffrey

Scanning Electron Microscopy

The electron optical properties of a field emission gun plus a twenty-stage linear accelerator system have been determined in the case where the entrance pupil of the system is defined by one of the electrode apertures.

The first part of the calculation concerns the electrical and geometrical parameters of triode and tetrode field emission guns which can give a fixed location of the source and a small spherical aberration coefficient.

The second part is related to the possibility of placing a tetrode field emission gun at the top of the linear accelerator of the scanning high voltage electron microscope which …


Recent Developments In Numerical Electron Optics, Erwin K. Kasper Jan 1984

Recent Developments In Numerical Electron Optics, Erwin K. Kasper

Scanning Electron Microscopy

The familiar methods for the numerical calculation of fields in electron optical devices are outlined briefly. for the solution of self- adjoint elliptic differential equations in orthogonal curvilinear coordinate systems a favourable ninepoint discretization is worked out which can be applied favourably e.g. to spherical mesh grids. The field calculation in magnetic deflection systems by means of an integral equation method is also highly advantageous. The methods for the field calculation can be still more improved by means of suitable hybrid procedures.

A second and shorter contribution is concerned with ray tracing and aberrations. Some favourable numerically stable new forms …


A Selected List Of Funded Research At Utah State University, Utah State University Jan 1984

A Selected List Of Funded Research At Utah State University, Utah State University

Undergraduate Research Office

List of current research projects at the university. Intended to help students as the develop their own projects.


Energy Selecting Electron Microscopy, F. P. Ottensmeyer Jan 1984

Energy Selecting Electron Microscopy, F. P. Ottensmeyer

Scanning Electron Microscopy

One of the major improvements in transmission electron microscopy over the last years is the addition of the capability of producing images with electrons that have specific narrow energy bands out of the total spectrum of energies they possess after having passed through the specimen. Though the idea is not new, the power of this application is only beginning to be recognized. Most simply, selection of elastically scattered electrons permits increased contrast in high resolution i mages in bright field, dark field, and diffraction. The use of combined elastic and inelastic signals adds entirely new contrast mechanisms, partially independent of …


Mineral Migration In The Wheat Kernel During Mill Conditioning, A. Al Saleh, B. Bouchet, D. J. Gallant Jan 1984

Mineral Migration In The Wheat Kernel During Mill Conditioning, A. Al Saleh, B. Bouchet, D. J. Gallant

Food Structure

The structure and histology of the kernel govern migration of water during conditioning or drying. Studies by the energy dispersive x-ray system under the SEM have shown that during an increase of water content from 11.5 to 16.5 per cent, soluble elements migrated from the peripheral bran, accumulated in the aleurone cells and passed through its walls to the endosperm of the kernel if the water content was above 14.5 per cent. Results of study were compared with analyses of milling fractions obtained under the same conditions.


Proceedings From The 21st Annual Marschall Invitational Cheese Seminar 1984, Various Authors Jan 1984

Proceedings From The 21st Annual Marschall Invitational Cheese Seminar 1984, Various Authors

Cheese Industry Conference

No abstract provided.


Computer Programs For Analyzing Certain Classes Of 3-D Electrostatic Fields With Two Planes Of Symmetry, Norm Franzen Jan 1984

Computer Programs For Analyzing Certain Classes Of 3-D Electrostatic Fields With Two Planes Of Symmetry, Norm Franzen

Scanning Electron Microscopy

At Tektronix, two classes of non-rotationally symmetric electrostatic lenses which lead to significant three-dimensional-field problems are currently under investigation. Extensive interactive computer programs have been developed to study these lens structures.

The first class is referred to as Klemperer lipped lenses; the accelerating quadrupole being the most important. Klemperer lenses are formed from shaped concentric cylindrical electrodes and employ two or three independent voltages. These lenses are predominantly of quadrupole type, but possess higher multipoles to correct for geometry distortion.

The second class of lenses, referred to as wafer-lenses, consists of lenses formed from spaced sequences of metal wafer electrodes …


Magnetic Electron Lenses, Wolfgang Dieter Riecke Jan 1984

Magnetic Electron Lenses, Wolfgang Dieter Riecke

Scanning Electron Microscopy

The electron optical properties of magnetic lenses are determined by the ratio S/D of gap width S to bore diameter D, by the actual size of the gap and by the lens strength NJ√U*. Objective lenses of particularly small aberrations are obtained if the specimen is positioned close to the center of the gap and if the width of the gap is made as small as possible. For projector lenses the best performance results if the lens is employed at its minimum focal length. Another aspect important for high resolution lenses is that a stigmator is available for the correction …


Progress In The Theory Of Electron-Beam Deflection, E. F. Ritz Jr. Jan 1984

Progress In The Theory Of Electron-Beam Deflection, E. F. Ritz Jr.

Scanning Electron Microscopy

Analysis, simulation, and design of electron-beam-deflection systems are reviewed in light of the current state of theoretical understanding. A brief review of the physical principles is followed by a detailed discussion of electrostatic, magnetostatic, mixed-field, traveling-wave, and scan-expansion systems. Each methodology is examined from a triple perspective: calculation of electromagnetic fields, calculation of electron trajectories, and calculation of the ensemble of trajectories forming the beam. Applications discussed include deflectors for television displays, lithography, scanning microscopes, and CRT oscillography. Developments of the last ten years are stressed, thereby supplementing and updating the author's previous review on this subject.

In field calculation, …


Magnetic Electron Lenses Ii, T. Mulvey Jan 1984

Magnetic Electron Lenses Ii, T. Mulvey

Scanning Electron Microscopy

Conventional magnetic electron lenses have evolved to their present highly developed state under the pressure of meeting the exacting requirements of high resolution electron microscopy. More recently, however, the desire to extract quantitative analytical information from the specimen has led to significant changes in the design of electron optical systems. The introduction of efficient lanthanum hexaboride cathodes and high beam current field-emission sources has strengthened this tendency. In addition, more complex lens systems than previously envisaged are now possible since microprocessors can be employed to assist in the rapid and reliable readjustment of the lens system, including the extensive alignment …


Optimization Of Stroboscopic Electron Deflection Systems, H. Rose, J. Zach Jan 1984

Optimization Of Stroboscopic Electron Deflection Systems, H. Rose, J. Zach

Scanning Electron Microscopy

Highly corrected electron-beam blanking systems (EBBS) are required for analyzing fast periodic processes at submicron spatial resolutions by stroboscopic methods. The deleterious degradation of the probe during the blanking operation can be avoided by a new straight-vision deflection system. Chopping of the beam is performed within this system by deflecting it across a knife edge. Calculations demonstrate that this system should be able to generate almost rectangular beam pulses with rise times of a few picoseconds and spot sizes smaller than 0.5 µm. The proposed EBBS consists of two wedge-shaped plate capacitors located symmetrically about the midplane of a rotationally …


Electron Image Simulation: A Complementary Processing Technique, Michael A. O'Keefe Jan 1984

Electron Image Simulation: A Complementary Processing Technique, Michael A. O'Keefe

Scanning Electron Microscopy

At present it is difficult to use direct image processing techniques to determine the specimen structure from electron micrographs obtained under non-linear imaging conditions, and impossible when the effects of dynamical scattering are strong (as in the case of thicker specimens). However, computing techniques are available to simulate high-resolution transmission electron microscope (HRTEM) images of postulated model structures. With these techniques it is possible to confirm the validity of interpretation of recorded micrographs, to help analyze crystal defects, to characterize microscope parameters, and to determine the ranges of validity of commonly used interpretive approximations. Because processed micrographs can lead to …


A Computer Controlled Scanning Transmission Electron Microscope Equipped With An Energy Analyzer For Special Investigations On Electron Diffraction- And Channeling Patterns, W. Hylla, H.-J. Kohl, H. Niedrig, D. Wendtland Jan 1984

A Computer Controlled Scanning Transmission Electron Microscope Equipped With An Energy Analyzer For Special Investigations On Electron Diffraction- And Channeling Patterns, W. Hylla, H.-J. Kohl, H. Niedrig, D. Wendtland

Scanning Electron Microscopy

A scanning electron microscope was equipped with a double tilting stage, driven by stepping motors, to investigate electron channeling patterns (ECPs) and large angle convergent beam patterns (LACBPs) of single crystals. Transmitted electrons may be energy-selected by a magnetic sector-field energy analyzer. The recording of experimental data and the experimental arrangement are controlled by a microprocessor system, including a picture storage unit of 512 x 512 pixels of 16 bit. Recorded patterns can be stored on 1 Megabyte floppies.

A set of useful programs allows one to perform calculations with stored patter ns, e.g., contrast enhancement or -inversion, noise reduction, …


Displays: Market And Technologies, Steve Blazo Jan 1984

Displays: Market And Technologies, Steve Blazo

Scanning Electron Microscopy

Displays provide the essential human interface to virtually all electronics instrumentation. The market is large with new applications appearing every year; sometimes with profound impact. Digital watches with liquid crystal displays appeared in the early 1970s and have virtually wiped out the mechanical timepiece industry. Personal computers with cathode ray tube (CRT) displays are proliferating with diverse applications in the industry and in the home. Work stations with high-resolution color displays are changing the way architects, draftsmen, and IC designers perform their job. The CRT is the dominant technology in today's market, and will, no doubt, continue to be for …


Field Emission Source Optics, L. W. Swanson Jan 1984

Field Emission Source Optics, L. W. Swanson

Scanning Electron Microscopy

The use of field emission processes as a means of generating high brightness sources of both electrons and ions is becoming of increasing practical use in electron/ion optical systems. A review is given of the source optics and emission characteristics of a zirconium oxide coated, <100> oriented, tungsten (Zr0/W(l00)), thermal field emitter electron (TFE) source and a liquid metal ion source (LMIS). The primary interest at present is the use of these high field sources in microprobe focusing columns where beam sizes of < 0.5 µm and target current densities of ~ 1 to 10 A/cm2 (in the case of a LMIS) and 102 to 104 A/cm2 (in the case …


Synthesis Of Electron Lenses, M. Szilagyi Jan 1984

Synthesis Of Electron Lenses, M. Szilagyi

Scanning Electron Microscopy

This paper is a review of different approaches to one of the most ambitious goals of Electron and Ion Optics: to produce elements and systems with prescribed first-order properties and minimal aberrations. Synthesis of such elements is usually done in two steps: the first is a search for a field distribution with the given properties and the second is the reconstruction of electrodes (pole pieces) that would produce this field distribution. The first problem can be solved by the use of different techniques: Calculus of Variations, Dynamic Programming or Function Minimization. The second one is more complicated and requires a …


Whole Stand Volume Tables For Quaking Aspen [Populus Tremuloides] In The Rocky Mountains [Colorado, Wyoming], Wayne D. Shepperd, H.T. Mowrer Jan 1984

Whole Stand Volume Tables For Quaking Aspen [Populus Tremuloides] In The Rocky Mountains [Colorado, Wyoming], Wayne D. Shepperd, H.T. Mowrer

Aspen Bibliography

Linear regression equations were developed to predict stand volumes for aspen given average stand basal area and average stand height. Tables constructed from these equations allow easy field estimation of gross merchantable cubic and board foot Scribner Rules per acre, and cubic meters per hectare using simple prism cruise data.