Digital Commons Network^™

Ecological And Evolutionary Considerations Of Large Scale Mosquito Control Programs, Harrison B. Tordoff

Journal of the Minnesota Academy of Science

No abstract provided.

Optics Of Wide Electron Beam Focusing, Zhou Li-Wei

Scanning Electron Microscopy

In the present paper, we have further studied an approach to the theoretical treatment of wide electron beam focusing, based on the application of the theory of focusing fields with arbitrary curved optical axis, considering the initial condition emitted from the cathode surface. It is assumed that the magnetic field vector B will be used instead of the magnetic scalar potential Ω and the electrostatic potential 𝞅 and the magnetic field vector B are known functions either by computation or experimentally in the laboratory system of coordinates. The new approach to the mathematical treatment appears to be a useful method …

The Application Of The Alternating Procedure Of H.A. Schwarz For Computing Three-Dimensional Electrostatic Fields In Electron-Optical Systems, Christoph H. Schaefer

Scanning Electron Microscopy

The numerical solution of three-dimensional electrostatic field problems in electron-optical devices with complicated boundaries requires the use of very large and fast computers. A numerical counterpart of the Alternating Procedure by H. A. Schwarz (SAP) makes efficient use of both storage space and time available on the computer and therefore represents a useful new method in this context. In this method. the domain of solution is decomposed into independent subdomains where the appropriate individual methods of solution may be chosen. Correspondingly. the original boundary value problem is decomposed into a sequence of boundary value problems in these subdomains. SAP requires …

Constrained Optimization Design Of An Electron Optical System, Chang-Xin Gu, Li-Ying Shan

Scanning Electron Microscopy

An electron optical system can be optimized using the "simplex method" or "complex method". By these methods, the final structure of an electron optical system, for example, an extended field lens (EFL), can be searched with a criterion of minimum objective parameter (in the present case, the coefficient of spherical aberration). Because there is no constraint in the simplex method, the constrained optimization method (the complex method) described in this paper is better than the simplex method in the design of electron optical systems. In the simplex method as well as the complex method, it is not necessary to know …

Study Of Space Charge Limitation Of Thermionic Cathodes In Triode Guns, A. Delâge, P. B. Sewell

Scanning Electron Microscopy

A computer program has been developed to compute the emission of cathodes from the fully space charge limited diode equation. The emission of four different gun arrangements with thermionic cathodes of the type used in electron microscopes is investigated. Microflat cathodes with a small (≤50𝜇m in diameter) fixed emitting area show several advantages for high brightness possibilities whereas other types of cathodes for which the emitting area increases with the brightness are usually limited by too great a total emission.

New Species Of Pectis (Asteraceae) From The West Indies, Mexico, And South America, David J. Keil

Biological Sciences

Four new species of Peetis are described: P. ericifolia from Barbuda, P. luckoviae from west-central Mexico, P. arida from Ecuador and Peru, and P. cajamarcana from Peru. Chromosome counts for P. erieifolza (n = 48) and P. luekoviae (n = 12) are presented. Relationships of the newly described taxa are discussed.

Thermionic Emission Studies Of Micro-Flat Single Crystal Lanthanum Hexaboride Cathodes, P. B. Sewell, A. Delâge

Scanning Electron Microscopy

A new type of high brightness thermionic cathode has been developed. The cathode utilises emission from a small flat surface (generally less than 50 μm diameter) prepared parallel to a specific crystal plane on a single crystal of Lanthanum Hexaboride. Emission from the rest of the single crystal is suppressed by the use of a high work function coating of pyrolytic graphite. When used in a conventional triode gun, the maximum total electron emission is controlled by the area of the micro-flat, the work function and the temperature of the emitter. The Wehnelt potential serves a minor role in controlling …

Microchannel Plates As Specialized Scanning Electron Microscopy Detectors, P. E. Russell

Scanning Electron Microscopy

The need for a specialized detector for low beam voltage and low beam current applications has led to the investigation of a microchannel plate detector for SEM. The application requirements are described in detail, with the case of integrated circuit metrology used as an example. The microchannel plate (MCP) detector has proven to meet almost all of the design objectives of a low voltage metrology SEM detector. The symmetry of the detector and the ability to mount it directly to the final pole piece are among the most important features.

Toward A Concise Definition And Perspective For Biology, Arthur V. Brown, Kristine Basinger Brown

Journal of the Arkansas Academy of Science

The content of introductory biology courses at the high school and college levels are currently being re-examined. Many biological educators favor revision of the high school biology courses to a format that directly addresses current social issues to "promote good citizenship". We believe it would be more meaningful to teach the fundamental principles of biology, the study of living systems. Properly defining biology, by defining a living system, should help identify important topics to include in a basic biology course. Emphasis should be placed on subjects which would contribute most to the development of a basic understanding of how all …

Promoting Soft Mast For Wildlife In Intensively Managed Forests, John J. Stransky, John H. Roese

Faculty Publications

The fruit of woody plants is important as food for wildlife (Martin et al. 1951, Lay 1965). The relation of fruit production to southern forest stand conditions has been explored in only a few studies. Fruit production is greater in forest clearings than in closed forest stands (Lay 1966, Elalls and Alcaniz 1968). In Georgia slash pine (Pinus elliottii) plantations, fruit yields of shrubs are greatest in 4-yeas-old stands, and soil disturbance in site preparation greatly reduces fruit yields (Johnson and Landers 1978). Total fruit production is greatest in 5-year-old bedded loblolly pine (P. taeda) plantations …

A Revision Of Kyllinga Rottb. (Cyperaceae) In Mexico And Central America, Gordon C. Tucker

Faculty Research & Creative Activity

No abstract provided.

A Revision Of Kyllinga Rottb. (Cyperaceae) In Mexico And Central America, Gordon Tucker

Faculty Research & Creative Activity

No abstract provided.

Superior Developmental Stability Of Heterozygotes At Enzyme Loci In Salmonid Fishes, Robb F. Leary, Fred W. Allendorf, Kathy L. Knudsen

Biological Sciences Faculty Publications

No abstract provided.

The Pan American Shorebird Program: A Progress Report, J. P. Myers, Gonzalo Castro, Brian Harrington, Marshall Howe, John L. Maron, Enrique Ortiz, Michel Sallaberry A., C. T. Schick, Elier Tablio

Biological Sciences Faculty Publications

No abstract provided.

Electrostatic And Magnetic Imaging Without Image Rotation, Zhou Li-Wei, Ni Guo-Qiang, Fang Er-Lun

Scanning Electron Microscopy

A method is discussed for designing electrostatic and magnetic imaging systems without image rotation. Tsukkerman's condition for an imaging system free of rotation does not appear to be applicable to practical designs. We have modified his theory to obtain two other conditions for the normalized axial electric potential V(z), the normalized axial magnetic induction G(z), and a lens strength parameter 𝞴 which can be interpreted as an eigen-value. Some analytical examples and numerical results are given.

The Influence Of Sample And Detector Angles Upon Auger Electron Signal, Robert L. Gerlach

Scanning Electron Microscopy

The effects of the sample to incident electron beam angle and of the detector. angle on the Auger electron signal are important for quantitative Auger analysis, particularly for Auger mapping and line scans. A first approximation, single scattering, mean free path model is employed to simulate the Auger signal resulting from a range of sample and detector angles. The model is single scattering in the sense that the excitation path is taken to be a straight line into the solid. A second model approximates multiple scattering by a normal distribution of ionizing flux angles about the incident beam direction.

Since …

Various Attempts To Reduce The Dimensions Of Magnetic Electron Lenses Used For High Voltage Microscopes, J. L. Balladore, R. Murillo, J. Trinquier

Scanning Electron Microscopy

Magnetic fields are used in electron microscopy for a variety of purposes: image formation, energy analysis and correction of astigmatism, for example.

We are interested in the problems of designing short focal length lenses to be used for focusing high energy electrons in the energy range 1-3 MeV.

These lenses are generally very large and we have tried to reduce their dimensions to simplify their construction and use. From this point of view, it is necessary to diminish the magnetic coil and the magnetic circuit iron.

Several solutions have been proposed in the case of the coil. We have obtained …

A Comparison Of Lanthanum Hexaboride, Cold Field Emission And Thermal Field Emission Electron Guns For Low Voltage Scanning Electron Microscopy, J. Orloff

Scanning Electron Microscopy

A comparison of lanthanum hexaboride, cold W(310) field emission and Zr/W thermal field emission cathodes was made by calculating the current-spot size relationship for each, using comparable lenses, to determine which would be suitable for high current operation at 1 keV beam energy, with a focused beam diameter < 0.05 μm. On the criteria of highest current, reasonable operating conditions for the gun for low noise operation and long term cathode stability it was found that the lanthanum hexaboride and cold field emission cathodes are inadequate or marginal and that the best performance is obtainable from the thermal field emission cathode.

Electron Detectors Used For Imaging In The Scanning Electron Microscope, V. N. E. Robinson

Scanning Electron Microscopy

Electron detectors used for imaging in the scanning electron microscope include those which detect secondary electrons, various portions of the backscattered electron signal, and the residual specimen current. The use of a different detector will often produce a different image of the same specimen. The information contained in these images depends upon the signal detected and the properties of the detector used. The choice of detector to be used depends upon the information desired.

Low Voltage Scanning Electron Microscopy, James B. Pawley

Scanning Electron Microscopy

The scanning electron microscope (SEM) usually operates with a beam voltage, V₀, in the range of 10-30 kV, even though many early workers suggested the use of lower voltages to increase topographic contrast and to reduce specimen charging and beam damage. The chief reason for this contradiction is low instrumental performance when V₀ = 1-3 kV. The problems include low source brightness, greater defocussing due to chromatic aberration, greater sensitivity to internal and external stray fields and difficulty in collecting the secondary electron signal without defocussing the probe. Recently considerable efforts have been made to overcome these …

Determination Of Optical Properties Of A Field Emission Gun Coupled With A Linear Accelerator For High Voltage Microscopy, M. Denizart, S. Roques, F. Sonier, B. Jouffrey

Scanning Electron Microscopy

The electron optical properties of a field emission gun plus a twenty-stage linear accelerator system have been determined in the case where the entrance pupil of the system is defined by one of the electrode apertures.

The first part of the calculation concerns the electrical and geometrical parameters of triode and tetrode field emission guns which can give a fixed location of the source and a small spherical aberration coefficient.

The second part is related to the possibility of placing a tetrode field emission gun at the top of the linear accelerator of the scanning high voltage electron microscope which …

Recent Developments In Numerical Electron Optics, Erwin K. Kasper

Scanning Electron Microscopy

The familiar methods for the numerical calculation of fields in electron optical devices are outlined briefly. for the solution of self- adjoint elliptic differential equations in orthogonal curvilinear coordinate systems a favourable ninepoint discretization is worked out which can be applied favourably e.g. to spherical mesh grids. The field calculation in magnetic deflection systems by means of an integral equation method is also highly advantageous. The methods for the field calculation can be still more improved by means of suitable hybrid procedures.

A second and shorter contribution is concerned with ray tracing and aberrations. Some favourable numerically stable new forms …

Energy Selecting Electron Microscopy, F. P. Ottensmeyer

Scanning Electron Microscopy

One of the major improvements in transmission electron microscopy over the last years is the addition of the capability of producing images with electrons that have specific narrow energy bands out of the total spectrum of energies they possess after having passed through the specimen. Though the idea is not new, the power of this application is only beginning to be recognized. Most simply, selection of elastically scattered electrons permits increased contrast in high resolution i mages in bright field, dark field, and diffraction. The use of combined elastic and inelastic signals adds entirely new contrast mechanisms, partially independent of …

Computer Programs For Analyzing Certain Classes Of 3-D Electrostatic Fields With Two Planes Of Symmetry, Norm Franzen

Scanning Electron Microscopy

At Tektronix, two classes of non-rotationally symmetric electrostatic lenses which lead to significant three-dimensional-field problems are currently under investigation. Extensive interactive computer programs have been developed to study these lens structures.

The first class is referred to as Klemperer lipped lenses; the accelerating quadrupole being the most important. Klemperer lenses are formed from shaped concentric cylindrical electrodes and employ two or three independent voltages. These lenses are predominantly of quadrupole type, but possess higher multipoles to correct for geometry distortion.

The second class of lenses, referred to as wafer-lenses, consists of lenses formed from spaced sequences of metal wafer electrodes …

Magnetic Electron Lenses, Wolfgang Dieter Riecke

Scanning Electron Microscopy

The electron optical properties of magnetic lenses are determined by the ratio S/D of gap width S to bore diameter D, by the actual size of the gap and by the lens strength NJ√U*. Objective lenses of particularly small aberrations are obtained if the specimen is positioned close to the center of the gap and if the width of the gap is made as small as possible. For projector lenses the best performance results if the lens is employed at its minimum focal length. Another aspect important for high resolution lenses is that a stigmator is available for the correction …

Progress In The Theory Of Electron-Beam Deflection, E. F. Ritz Jr.

Scanning Electron Microscopy

Analysis, simulation, and design of electron-beam-deflection systems are reviewed in light of the current state of theoretical understanding. A brief review of the physical principles is followed by a detailed discussion of electrostatic, magnetostatic, mixed-field, traveling-wave, and scan-expansion systems. Each methodology is examined from a triple perspective: calculation of electromagnetic fields, calculation of electron trajectories, and calculation of the ensemble of trajectories forming the beam. Applications discussed include deflectors for television displays, lithography, scanning microscopes, and CRT oscillography. Developments of the last ten years are stressed, thereby supplementing and updating the author's previous review on this subject.

In field calculation, …

Magnetic Electron Lenses Ii, T. Mulvey

Scanning Electron Microscopy

Conventional magnetic electron lenses have evolved to their present highly developed state under the pressure of meeting the exacting requirements of high resolution electron microscopy. More recently, however, the desire to extract quantitative analytical information from the specimen has led to significant changes in the design of electron optical systems. The introduction of efficient lanthanum hexaboride cathodes and high beam current field-emission sources has strengthened this tendency. In addition, more complex lens systems than previously envisaged are now possible since microprocessors can be employed to assist in the rapid and reliable readjustment of the lens system, including the extensive alignment …

Optimization Of Stroboscopic Electron Deflection Systems, H. Rose, J. Zach

Scanning Electron Microscopy

Highly corrected electron-beam blanking systems (EBBS) are required for analyzing fast periodic processes at submicron spatial resolutions by stroboscopic methods. The deleterious degradation of the probe during the blanking operation can be avoided by a new straight-vision deflection system. Chopping of the beam is performed within this system by deflecting it across a knife edge. Calculations demonstrate that this system should be able to generate almost rectangular beam pulses with rise times of a few picoseconds and spot sizes smaller than 0.5 µm. The proposed EBBS consists of two wedge-shaped plate capacitors located symmetrically about the midplane of a rotationally …

Electron Image Simulation: A Complementary Processing Technique, Michael A. O'Keefe

Scanning Electron Microscopy

At present it is difficult to use direct image processing techniques to determine the specimen structure from electron micrographs obtained under non-linear imaging conditions, and impossible when the effects of dynamical scattering are strong (as in the case of thicker specimens). However, computing techniques are available to simulate high-resolution transmission electron microscope (HRTEM) images of postulated model structures. With these techniques it is possible to confirm the validity of interpretation of recorded micrographs, to help analyze crystal defects, to characterize microscope parameters, and to determine the ranges of validity of commonly used interpretive approximations. Because processed micrographs can lead to …

A Computer Controlled Scanning Transmission Electron Microscope Equipped With An Energy Analyzer For Special Investigations On Electron Diffraction- And Channeling Patterns, W. Hylla, H.-J. Kohl, H. Niedrig, D. Wendtland

Scanning Electron Microscopy

A scanning electron microscope was equipped with a double tilting stage, driven by stepping motors, to investigate electron channeling patterns (ECPs) and large angle convergent beam patterns (LACBPs) of single crystals. Transmitted electrons may be energy-selected by a magnetic sector-field energy analyzer. The recording of experimental data and the experimental arrangement are controlled by a microprocessor system, including a picture storage unit of 512 x 512 pixels of 16 bit. Recorded patterns can be stored on 1 Megabyte floppies.

A set of useful programs allows one to perform calculations with stored patter ns, e.g., contrast enhancement or -inversion, noise reduction, …