Physics Commons^™

Enhancing The Performance Of Organic Thin Film Transistors By Cross-Linking The Organic Gate Dielectric, Soheila Naderi Gohar

Electronic Thesis and Dissertation Repository

Amongst various surface modification techniques, hyperthermal hydrogen induced cross-linking (HHIC) has been used to modify the surface of polymeric samples. In this novel and innovative technique neutral hydrogen projectiles with appropriate kinetic energy are produced to generate carbon radicals on the impacted surface through the collision-induced C-H bond breaking. Subsequently, this phenomenon results in cross-linking hydrocarbon chains in the treated polymeric samples.

Verifying the validity of cross-linking process through experiments is the target of first part of presented dissertation. Spin-coated poly(methyl methacrylate) (PMMA) films on silicon wafer were exposed to hydrogen projectiles for different durations, while the other conditions related …

Measuring The Refractive Index Of Infrared Materials By Dual-Wavelength Fabry-Perot Interferometry, Griffin Taylor

Physics

No abstract provided.

Mechanical, Electronic And Optical Properties Of Multi-Ternary Semiconductor Alloys, Dongguo Chen

Dissertations

The ability to obtain tunable properties with composition makes multi-ternary alloys extremely useful for a variety of applications in semiconductor devices and is of significant interest in experimental and theoretical research. This dissertation investigates the mechanical, electronic and optical properties of multi-ternary, i.e., binary, ternary and quaternary, semiconductor alloys using analytical methods and first-principles calculations.

For the calculations of mechanical properties, existing models on the average shear modulus of III-V & II-VI binary semiconductors are revised. New expressions are developed for the average Young’s modulus as well as the shear modulus and Young’s modulus on (111) plane for these compounds. …

Mueller Based Scatterometry And Optical Characterization Of Semiconductor Materials, Gangadhara Raja Muthinti

Legacy Theses & Dissertations (2009 - 2024)

Scatterometry is one of the most useful metrology methods for the characterization and control of critical dimensions (CD) and the detailed topography of periodic structures found in microelectronics fabrication processes. Spectroscopic ellipsometry (SE) and normal incidence reflectometry (NI) based scatterometry are the most widely used optical methodologies for metrology of these structures. Evolution of better optical hardware and faster computing capabilities led to the development of Mueller Matrix (MM) based Scatterometry (MMS). Dimensional metrology using full Mueller Matrix (16 element) scatterometry in the wavelength range of 245nm-1000nm was discussed in this work. Unlike SE and NI, MM data provides complete …