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Articles 1 - 3 of 3
Full-Text Articles in Physics
Nanomechanics Of Flexoelectric Switching, J. Očenášek, Haidong Lu, C. W. Bark, Chang-Beom Eom, J. Alcalá, G. Catalan, Alexei Gruverman
Nanomechanics Of Flexoelectric Switching, J. Očenášek, Haidong Lu, C. W. Bark, Chang-Beom Eom, J. Alcalá, G. Catalan, Alexei Gruverman
Materials Research Science and Engineering Center: Faculty Publications
We examine the phenomenon of flexoelectric switching of polarization in ultrathin films of barium titanate induced by a tip of an atomic force microscope (AFM). The spatial distribution of the tip-induced flexoelectricity is computationally modeled both for perpendicular mechanical load (point measurements) and for sliding load (scanning measurements), and compared with experiments. We find that (i) perpendicular load does not lead to stable ferroelectric switching in contrast to the load applied in the sliding contact load regime, due to nontrivial differences between the strain distributions in both regimes: ferroelectric switching for the perpendicular load mode is impaired by a strain …
Confocal Raman Spectroscopy And Afm For Evaluation Of Sidewalls In Type Ii Superlattice Fpas, D. A. Tenne
Confocal Raman Spectroscopy And Afm For Evaluation Of Sidewalls In Type Ii Superlattice Fpas, D. A. Tenne
Physics Faculty Publications and Presentations
We propose to utilize confocal Raman spectroscopy combined with high resolution atomic force microscopy (AFM) for nondestructive characterisation of the sidewalls of etched and passivated small pixel (24 μm×24 μm) focal plane arrays (FPA) fabricated using LW/LWIR InAs/GaSb type-II strained layer superlattice (T2SL) detector material. Special high aspect ratio Si and GaAs AFM probes, with tip length of 13 μm and tip aperture less than 7°, allow characterisation of the sidewall morphology. Confocal microscopy enables imaging of the sidewall profile through optical sectioning. Raman spectra measured on etched T2SL FPA single pixels enable us to quantify the …
Atomic Force Microscopes, Rob Snyder, Jennifer Welborn
Atomic Force Microscopes, Rob Snyder, Jennifer Welborn
Nanotechnology Teacher Summer Institutes
PowerPoint overview. A student activity that builds an atomic force microscope model.