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Focused Ion Beam Milled Copt Magnetic Force Microscopy Tips For High Resolution Domain Images, L. Gao, Lanping Yue, T. Yokota, Ralph Skomski, Sy-Hwang Liou, H. Takahoshi, Hitoshi Saito, S. Ishio
Focused Ion Beam Milled Copt Magnetic Force Microscopy Tips For High Resolution Domain Images, L. Gao, Lanping Yue, T. Yokota, Ralph Skomski, Sy-Hwang Liou, H. Takahoshi, Hitoshi Saito, S. Ishio
Department of Physics and Astronomy: Faculty Publications
Abstract—High-coercivity CoPt magnetic force microscope tips have been modified by focused ion beam milling to improve the resolution of magnetic domain images. The magnetic materials around the apex have been removed, leaving a 30-nm diameter magnetic particle at the tip end. Due to the smaller amount of magnetic material, the stray field from this new tip is significantly reduced, and the spatial resolution of the magnetic domain images is improved. The tip is used to obtain high-resolution domain images of a CoCrPt-SiO2/Ru perpendicular recording medium with linear recording densities from 800 to 1000 kfci. Magnetic patterns of 900 kfci, corresponding …