Physics Commons^™

Infrared Dielectric Anisotropy And Phonon Modes Of Rutile Tio2, Rafal Korlacki, Stefan Schöche, Tino Hofmann, Tom E. Tiwald, Mathias Schubert

Department of Electrical and Computer Engineering: Faculty Publications

Spectroscopic ellipsometry in the mid-infrared and far-infrared spectral range and generalized ellipsometry in the mid-infrared spectral range are used to investigate the anisotropic dielectric response of rutile TiO₂. The ordinary and extraordinary dielectric function tensor components and all infrared active phonon mode parameters of single crystalline rutile TiO₂ are determined with high accuracy for wavelengths from 3 μm to 83 μm. The data were acquired from samples of (001), (100), and (111) surfaces cut from bulk single crystals. A factorized model dielectric function is employed in order to determine the frequencies and damping parameters of the transverse …