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Out-Of-Plane Electron Transport In Finite Layer Mos2, R Holzapfel, Jake Weber, Pavel Lukashev, Andrew Stollenwerk
Out-Of-Plane Electron Transport In Finite Layer Mos2, R Holzapfel, Jake Weber, Pavel Lukashev, Andrew Stollenwerk
Faculty Publications
Ballistic electron emission microscopy (BEEM) has been used to study the processes affecting electron transport along the [0001] direction of finite layer MoS2 flakes deposited onto the surface of Au/Si(001) Schottky diodes. Prominent features present in the differential spectra from the MoS2 flakes are consistent with the density of states of finite layer MoS2 calculated using density functional theory. The ability to observe the electronic structure of the MoS2 appears to be due to the relatively smooth density of states of Si in this energy range and a substantial amount of elastic or quasi-elastic scattering along the MoS2/Au/Si(001) path. Demonstration …