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Full-Text Articles in Physics
Nonlinear Optimal Filter Technique For Analyzing Energy Depositions In Tes Sensors Driven Into Saturation, Benjamin Shank, Jeffrey Yen, Blas Cabrera, John Mark Kreikebaum, Robert Moffatt, Peter Redl, Betty Young, Paul Brink, Matthew Cherry, Astrid Tomada
Nonlinear Optimal Filter Technique For Analyzing Energy Depositions In Tes Sensors Driven Into Saturation, Benjamin Shank, Jeffrey Yen, Blas Cabrera, John Mark Kreikebaum, Robert Moffatt, Peter Redl, Betty Young, Paul Brink, Matthew Cherry, Astrid Tomada
Faculty Publications
We present a detailed thermal and electrical model of superconducting transition edge sensors(TESs) connected to quasiparticle (qp) traps, such as the W TESs connected to Al qp traps used for CDMS (Cryogenic Dark Matter Search) Ge and Si detectors. We show that this improvedmodel, together with a straightforward time-domain optimal filter, can be used to analyze pulses well into the nonlinear saturation region and reconstruct absorbed energies with optimal energyresolution.
Analysis Of Electrodeposited Nickel-Iron Alloy Film Composition Using Particle-Induced X-Ray Emission, Alyssa Frey, Nicholas Wozniak, Timothy Nagi, Matthew Keller, J. Mark Lunderberg, Graham F. Peaslee, Paul Deyoung, Jennifer R. Hampton
Analysis Of Electrodeposited Nickel-Iron Alloy Film Composition Using Particle-Induced X-Ray Emission, Alyssa Frey, Nicholas Wozniak, Timothy Nagi, Matthew Keller, J. Mark Lunderberg, Graham F. Peaslee, Paul Deyoung, Jennifer R. Hampton
Faculty Publications
The elemental composition of electrodeposited NiFe thin films was analyzed with particle-induced X-ray emission (PIXE). The thin films were electrodeposited on polycrystalline Au substrates from a 100mM NiSO4, 10 mM FeSO4, 0.5M H3BO3, and 1M Na2SO4 solution. PIXE spectra of these films were analyzed to obtain relative amounts of Ni and Fe as a function of deposition potential and deposition time. The results show that PIXE can measure the total deposited metal in a sample over at least four orders of magnitude with similar fractional uncertainties. The technique is …