Physics Commons^™

Phenomena Relating To Charge In Insulators: Macroscopic Effects And Microscopic Causes, Jacques Cazaux, Claude Le Gressus

Scanning Microscopy

Conservation of current under steady-state conditions makes it possible to determine the sign of charges trapped in an insulator subjected to ionizing radiation. The maximum value of the surface potential can thus be estimated.

On the basis of a given trapped charge distribution, the pattern of the electrical field and of the potential can thus be established, and the influence of the shape of the sample and its environment can be clearly shown. Change of trapped charges with time (at the start and after irradiation) is then examined. Finally, the microscopic causes of trapping of charge is suggested by analogy …

A Loading Device For Fracture Testing Of Compact Tension Specimens In The Scanning Electron Microscope, Jügen Rödel, James F. Kelly, Mark R. Stoudt, Stephen J. Bennison

Scanning Microscopy

A loading device for performing fracture experiments on compact tension specimens in the SEM has been designed. Its key elements are a piezoelectric translator for applying controlled displacements to the loading points on the specimen and a load cell to measure applied loads. The effective transmission of displacement from the piezoelectric driver to the specimen was found to be the major mechanical design problem. The peripheral equipment includes a function generator and a high voltage amplifier that drives the piezoelectric translator as well as a video overlay and standard video equipment to record the image continuously during the course of …