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Removal Of Multiple-Tip Artifacts From Scanning Tunneling Microscope Images By Crystallographic Averaging, Jack C. Straton, Bill Moon, Taylor T. Bilyeu, Peter Moeck
Removal Of Multiple-Tip Artifacts From Scanning Tunneling Microscope Images By Crystallographic Averaging, Jack C. Straton, Bill Moon, Taylor T. Bilyeu, Peter Moeck
Physics Faculty Publications and Presentations
Crystallographic image processing (CIP) techniques may be utilized in scanning probe microscopy (SPM) to glean information that has been obscured by signals from multiple probe tips. This may be of particular importance for scanning tunneling microscopy (STM) and requires images from samples that are periodic in two dimensions (2D). The image-forming current for double-tips in STM is derived with a slight modification of the independent-orbital approximation (IOA) to allow for two or more tips. Our analysis clarifies why crystallographic averaging works well in removing the effects of a blunt STM tip (that consists of multiple mini-tips) from recorded 2D periodic …