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Articles 1 - 8 of 8
Full-Text Articles in Physics
An Enhanced Operational Definition Of Dielectric Breakdown For Dc Voltage Step-Up Tests, Allen Andersen, Jr Dennison
An Enhanced Operational Definition Of Dielectric Breakdown For Dc Voltage Step-Up Tests, Allen Andersen, Jr Dennison
Journal Articles
The imprecise definition of breakdown in the ASTM D3755-14 standard can misidentify breakdown. If the recommended test circuit current sensing element threshold is set too high, breakdown may occur undetected. Conversely, false positives may result from designating a low current threshold. An operational definition of breakdown much less sensitive to these pitfalls is outlined herein. This enhanced definition of breakdown is based on the average rate of change of the leakage current with increasing voltage, rather than a simple current threshold, avoiding ambiguous association with anomalies in current traces. For tests that continuously monitor leakage current, breakdown can be detected …
Highly Accelerated Test Method For Characterizing Likelihood Of Breakdown In Hvdc Dielectric Materials, Allen Andersen, Jr Dennison
Highly Accelerated Test Method For Characterizing Likelihood Of Breakdown In Hvdc Dielectric Materials, Allen Andersen, Jr Dennison
Journal Articles
Increasing application and development of HVDC technologies emphasizes the need for improved characterization of candidate insulating materials. Accurately predicting the lifetime to breakdown of dielectric materials by means of accelerated voltage step-up to breakdown tests can be prohibitively time consuming. Step-up to breakdown tests with sufficiently slow voltage ramp rates that continuously monitor leakage current have detected a distribution of DC partial discharge (DCPD) events occurring prior to breakdown, which increase with increasing field. These DCPD distributions are shown to correlate strongly with the likelihood of breakdown for four common polymers. Given that hundreds of DCPD events are typically observed …
Perspectives On The Distributions Of Esd Breakdowns For Spacecraft Charging Applications, Allen Andersen, Krysta Moser, Jr Dennison
Perspectives On The Distributions Of Esd Breakdowns For Spacecraft Charging Applications, Allen Andersen, Krysta Moser, Jr Dennison
Journal Articles
Electrostatic discharge (ESD) continues to pose significant risks to space missions despite decades of intense study. Tabulated values of material breakdown strength used in spacecraft charging models are often based on cursory measurements that may not be fully relevant to a given mission. Materials physics offers insight into the pertinent variables that affect breakdown and how to address them experimentally for spacecraft applications. We present measured distributions of ESD data across several test configurations for three polymeric materials that, taken together, begin to provide an understanding of how to estimate the likelihood of ESD events over a spacecraft’s mission lifetime. …
Dependence Of Electrostatic Field Strength On Voltage Ramp Rate For Spacecraft Materials, Krysta Moser, Allen Andersen, Jr Dennison
Dependence Of Electrostatic Field Strength On Voltage Ramp Rate For Spacecraft Materials, Krysta Moser, Allen Andersen, Jr Dennison
Journal Articles
This work investigated the dependence of electrostatic field strength for spacecraft materials on voltage ramp rate, by applying an increasing incremental electrostatic field until electrostatic breakdown occurred. Tests on Kapton E found that at ramp rates two or three orders of magnitude lower than the maximum recommended rate, the electrostatic breakdown field, FESD was lower by a factor of two or more. This suggests that tabulated values of FESD, which have been used by the spacecraft charging community, could substantially overestimate FESD in common slowly evolving spacecraft situations. This study expanded these ramp rate tests to include a wider range …
Pea System Modeling And Signal Processing For Measurement Of Volume Charge Distributions In Thin Dielectric Films, Lee H. Pearson, Jr Dennison, Erick W. Griffiths, Anthony C. Pearson
Pea System Modeling And Signal Processing For Measurement Of Volume Charge Distributions In Thin Dielectric Films, Lee H. Pearson, Jr Dennison, Erick W. Griffiths, Anthony C. Pearson
Journal Articles
This paper discusses our effort to develop advanced pulsed electroacoustic (PEA) measurement system capabilities that incorporate (1) improved signal processing tools for increased signal/noise ratios; and (2) integrated PEA modeling tools. In addition, we emphasize state-of-the-art system electronic components, integrated environmental controls, and sensor improvements required to achieve high spatial resolution while maintaining reasonable temporal resolution for both ambient and in vacuo measurements of thin dielectrics charged using electron beam injection, which is most applicable for spacecraft charging tests. PEA measurement systems provide an important tool to investigate the spatial extent and dynamic evolution of embedded charge distributions in thin …
Cathodoluminescence Studies Of Defects In Coated Boron Nitride, Kévin Guerch, Justin Dekany, Jr Dennison, Thierry Paulmier, Sophie Guillemet-Fritsch, Pascal Lenormand
Cathodoluminescence Studies Of Defects In Coated Boron Nitride, Kévin Guerch, Justin Dekany, Jr Dennison, Thierry Paulmier, Sophie Guillemet-Fritsch, Pascal Lenormand
Journal Articles
Optical emission properties of Boron Nitride (BN) substrates, BN with alumina (Al2O3) coating, and thermally-annealed alumina-coated boron nitride (an-BN/Al2O3) were investigated under electron irradiation using cathodoluminescence (CL) measurements. Tests were performed temperatures ranging from ~100 K to ~300 K, with monoenergetic beams from 5 keV to 30 keV, and electron flux densities from 1 nA.cm-2 to 500 nA.cm-2. These experiments were conducted to identify the effects of coating and thermal annealing on the nature and occupation of defect states in different samples with BN substrates. Previous studies have shown that these treatments can limit the charging of BN substrates. Consequently, …
Density Of State Models And Temperature Dependence Of Radiation Induced Conductivity, Jodie Corbridge Gillespie, Jr Dennison, Alec M. Sim
Density Of State Models And Temperature Dependence Of Radiation Induced Conductivity, Jodie Corbridge Gillespie, Jr Dennison, Alec M. Sim
Journal Articles
Expressions are developed for radiation induce conductivity (RIC) over an extended temperature range, based on density of states models for highly disordered insulating materials. A general discussion of the DOS of can be given using two simple types of DOS distributions of defect states within the bandgap for disordered materials are considered, one that monotonically decreases within the bandgap and one with a distribution peak within the band gap. Three monotonically decreasing models (exponential, power law, and linear), and two peaked models (Gaussian and delta function) are considered, plus limiting cases with a uniform DOS for each type. Variations using …
Temporal And Spatial Correlations In Electron-Induced Arcs Of Adjacent Dielectric Islands, Justin Christensen, Jr Dennison, Justin Dekany
Temporal And Spatial Correlations In Electron-Induced Arcs Of Adjacent Dielectric Islands, Justin Christensen, Jr Dennison, Justin Dekany
Journal Articles
This study investigates very short duration (