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Electron Induced Charging And Arcing Of Multilayered Dielectric Materials, Jr Dennison, Gregory Wilson, Amberly Evans, Justin Dekany
Electron Induced Charging And Arcing Of Multilayered Dielectric Materials, Jr Dennison, Gregory Wilson, Amberly Evans, Justin Dekany
Amberly Evans
Measurements of the charge distribution in electron-bombarded, thin-film, multilayered dielectric samples showed that charging of multilayered materials evolves with time and is highly dependent on incident energy; this is driven by electron penetration depth, electron emission and material conductivity. Based on the net surface potential’s dependence on beam current, electron range, electron emission and conductivity, measurements of the surface potential, displacement current and beam energy allow the charge distribution to be inferred. To take these measurements, a thin-film disordered SiO2 structure with a conductive middle layer was charged using 200 eV and 5 keV electron beams with regular 15 s …
Extending The Band Model Of Disordered Sio2 Through Cathodoluminescence Studies, Amberly Evans, Gregory Wilson, Jr Dennison, Justin Dekany
Extending The Band Model Of Disordered Sio2 Through Cathodoluminescence Studies, Amberly Evans, Gregory Wilson, Jr Dennison, Justin Dekany
Amberly Evans
Optical coatings of disordered thin film SiO2/SiOx dielectric samples on reflective metal substrates exhibited electron-induced luminescence (cathodoluminescence) under electron beam irradiation in an ultrahigh vacuum chamber at the USU facilities,. These experiments provided measurements of the absolute radiance and emission spectra as functions of incident electron energy, flux and power over a range of sample temperatures (300 K to 40 K). Early results from these experiments have led to a preliminary model of the band structure of highly disordered trapped states within the band gap of SiO2. We now extend this model to further describe …