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Secondary Electron Production And Transport Mechanisms By Measurement Of Angle-Energyresolved Cross Sections Of Secondary And Backscattered Electrons, Jason Kite, John R. Dennison
Secondary Electron Production And Transport Mechanisms By Measurement Of Angle-Energyresolved Cross Sections Of Secondary And Backscattered Electrons, Jason Kite, John R. Dennison
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The angle dependence of emitted electron spectra from a polycrystalline Au surface has been measured at several incident electron beam energies. The range of incident energies (~100 eV to 2500 eV) extends from below the first crossover energy, through Emax, to above the second crossover energy. The traditional distinction between secondary electrons (50 eV) is found to be inconsistent with our energy- and angle-resolved measurements. We suggest a more “natural” delineation occurs at the local minima of the emission spectra; this feature is studied as a function of incident energy and emission angle. This work is also supported by the …