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Full-Text Articles in Physics
Dynamic Secondary Electron Emission In Dielectric/Conductor Mixed, Leandro Olano, Isabel Montero, María E. Dávila, A. Jacas, M. A. Rodriguez, Jr Dennison
Dynamic Secondary Electron Emission In Dielectric/Conductor Mixed, Leandro Olano, Isabel Montero, María E. Dávila, A. Jacas, M. A. Rodriguez, Jr Dennison
Conference Proceedings
Secondary Emission Yield (SEY) of dielectric materials is of great importance for prediction and testing of the Multipaction discharge in RF components for space applications. An atypical behavior of the SEY of coatings composed by a mixture of conductor and dielectric microparticles was reported and modeled in [1]; in this original model, the interactions between dielectric and conductor particles were not taken into account, but an effective action of the surface voltage generated within the sample was included. The aim of the present contribution is to more accurately model the effect the electric fields between dielectric and conductor particles have …
The Role Of Bandgap In The Secondary Electron Emission Of Small Bandgap Semiconductors: Studies Of Graphitic Carbon, Neal E. Nickles
The Role Of Bandgap In The Secondary Electron Emission Of Small Bandgap Semiconductors: Studies Of Graphitic Carbon, Neal E. Nickles
All Graduate Theses and Dissertations, Spring 1920 to Summer 2023
The question of whether the small bandgaps of semiconductors play a significant role in their secondary electron emission properties is investigated by studying evaporated graphitic amorphous carbon, which has a roughly 0.5 eV bandgap, in comparison with microcrystalline graphite, which has zero bandgap. The graphitic amorphous carbon is found to have a 30% increase in its maximum secondary electron yield over that of two microcrystalline graphite samples with comparable secondary electron yields: highly oriented pyrolytic graphite and colloidal graphite. The potentially confounding influence of the vacuum level has been isolated through the measurement of the photoelectron onset energy of the …
Measurement Of Angle-Resolved Secondary Electron Spectra, Robert Davies
Measurement Of Angle-Resolved Secondary Electron Spectra, Robert Davies
All Graduate Theses and Dissertations, Spring 1920 to Summer 2023
Theoretical formulations of secondary electron emission over the past 20 years have exceeded the confirming ability of available measurements. An instrument has been developed and tested for the purpose of obtaining simultaneous angle- and energy-resolved (AER) secondary and backscattered electron measurements for energetic electrons incident on conducting surfaces. The instrument is found to be in good working order and the data quality found to be excellent for nearly all angles and energies investigated. A representative set of AER measurements has been acquired for 1500 eV electrons normally incident on polycrystalline gold. The data have been used to construct angle-resolved (AR) …
An Instrument For Experimental Secondary Electron Emission Investigations, With Application To The Spacecraft Charging Problem, Robert Davies
An Instrument For Experimental Secondary Electron Emission Investigations, With Application To The Spacecraft Charging Problem, Robert Davies
All Graduate Theses and Dissertations, Spring 1920 to Summer 2023
Secondary electron emission (SEE) and incident-particle backscattering are important processes accompanying the impact of energetic electrons and ions on surfaces. The phenomena play a key role in the buildup of electrical charge on spacecraft surfaces. and are therefore of particular interest to scientists attempting to model spacecraft charging. In response to a demonstrated need for data, techniques for determining total secondary electron (SE) and backscatter (BS) yields S and n, and associated scattering-angle-resolved, scattering-energy-resolved, and simultaneous angle-energy-resolved yields have been developed. Further, an apparatus capable of making the necessary measurements for experimental determination of these quantities-for conducting materials in …