Physics Commons^™

Electron Transport Models And Precision Measurements With The Constant Voltage Conductivity Method, Justin Dekany, Jr Dennison, Alec Sim, Jerilyn Brunson

Graduate Student Publications

Recent advances are described in the techniques, resolution, and sensitivity of the Constant Voltage Conductivity (CVC) method and the understanding of the role of charge injection mechanisms and the evolution of internal charge distributions in associated charge transport theories. These warrant reconsideration of the appropriate range of applicability of this test method to spacecraft charging. We conclude that under many (but not all) common spacecraft charging scenarios, careful CVC tests provide appropriate evaluation of conductivities down to ≈10-22 (Ω-cm)-1, corresponding to decay times of many years.

We describe substantial upgrades to an existing CVC chamber, which improved the precision of …

Measurement Methods Of Electron Emission Over A Full Range Of Sample Charging, R. Hoffmann, John R. Dennison

All Physics Faculty Publications

Spacecraft charging codes require accurate models of electron yields as a function of accumulated charge to correctly predict the charge build up on spacecraft. The accumulated charge creates equilibrium surface potentials on spacecraft resulting from interactions with the space plasma environment. There is, however, a complex relation between these emission properties and the charge built up in spacecraft insulators.

This paper focuses on different methods appropriate to determine the fundamental electronic material property of total electron yield as the materials accumulate charge. Three methods for determining the uncharged total yield are presented:

(i) The DC Continuous Beam Method is a …

Electron-Induced Electron Yields Of Uncharged Insulating Materials, Ryan Carl Hoffmann

All Graduate Theses and Dissertations, Spring 1920 to Summer 2023

Presented here are electron-induced electron yield measurements from high-resistivity, high-yield materials to support a model for the yield of uncharged insulators. These measurements are made using a low-fluence, pulsed electron beam and charge neutralization to minimize charge accumulation. They show charging induced changes in the total yield, as much as 75%, even for incident electron fluences of <3 fC/mm², when compared to an uncharged yield. The evolution of the yield as charge accumulates in the material is described in terms of electron recapture, based on the extended Chung and Everhart model of the electron emission spectrum and the dual dynamic …

Measurements Of The Secondary Electron Emission Properties Of Insulators, Clint D. Thomson

All Graduate Theses and Dissertations, Spring 1920 to Summer 2023

Measurements of the electron-induced electron emission properties of insulators are important to many applications including spacecraft charging, scanning electron microscopy, electron sources, and particle detection technology. However, these measurements are difficult to make since insulators can charge either negatively or positively under charge particle bombardment that in turn alters insulator emissions. In addition, incident electron bombardment can modify the conductivity, internal charge distribution, surface potential, and material structure in ways that are not well understood. A primary goal of this dissertation work has been to make consistent and accurate measurements of the uncharged electron yields for insulator materials using innovative …

Electron Emission Properties Of Insulator Materials Pertinent To The International Space Station, C. D. Thomson, V. V. Zavyalov, John R. Dennison, Jodie Corbridge

All Physics Faculty Publications

We present the results of our measurements of the electron emission properties of selected insulating and conducting materials used on the International Space Station (ISS). Utah State University (USU) has performed measurements of the electron-, ion-, and photon-induced electron emission properties of conductors for a few years, and has recently extended our capabilities to measure electron yields of insulators, allowing us to significantly expand current spacecraft material charging databases. These ISS materials data are used here to illustrate our various insulator measurement techniques that include: i) Studies of electron-induced secondary and backscattered electron yield curves using pulsed, low current electron …

Phenomena Relating To Charge In Insulators: Macroscopic Effects And Microscopic Causes, Jacques Cazaux, Claude Le Gressus

Scanning Microscopy

Conservation of current under steady-state conditions makes it possible to determine the sign of charges trapped in an insulator subjected to ionizing radiation. The maximum value of the surface potential can thus be estimated.

On the basis of a given trapped charge distribution, the pattern of the electrical field and of the potential can thus be established, and the influence of the shape of the sample and its environment can be clearly shown. Change of trapped charges with time (at the start and after irradiation) is then examined. Finally, the microscopic causes of trapping of charge is suggested by analogy …