Physics Commons^™

Pulsed Electroacoustic Measurements Of Polymers Irradiated With Low Energy Monoenergetic Electrons, Zachary Gibson, Jr Dennison

Physics Student Research

Understanding the dynamics and accumulation of embedded charge in dielectric materials is paramount for many applications from HVDC power transmission to spacecraft charging. The pulsed electroacoustic (PEA) method allows for nondestructive measurements of embedded charge distributions in dielectrics. The spatial resolution of PEA measurements are typically ~10 μm. However, some of the most deleterious spacecraft charging events result from electron fluxes with 10 keV to 50 keV energies, resulting in electron ranges of 1's to 10's of μm. Due to the resolution of the PEA method and the superposition of the interfacial charge with the deposited charge distribution, it is …

Temporal And Spatial Correlations In Electron-Induced Arcs Of Adjacent Dielectric Islands, Justin Christensen, Jr Dennison, Justin Dekany

Journal Articles

This study investigates very short duration (

Electron Transport Models And Precision Measurements With The Constant Voltage Conductivity Method, Justin Dekany, Jr Dennison, Alec Sim, Jerilyn Brunson

Graduate Student Publications

Recent advances are described in the techniques, resolution, and sensitivity of the Constant Voltage Conductivity (CVC) method and the understanding of the role of charge injection mechanisms and the evolution of internal charge distributions in associated charge transport theories. These warrant reconsideration of the appropriate range of applicability of this test method to spacecraft charging. We conclude that under many (but not all) common spacecraft charging scenarios, careful CVC tests provide appropriate evaluation of conductivities down to ≈10-22 (Ω-cm)-1, corresponding to decay times of many years.

We describe substantial upgrades to an existing CVC chamber, which improved the precision of …

The Effect Of Low Energy Electron And Uv/Vis Radiation Aging On The Electron Emission Properties And Breakdown Of Thin-Film Dielectrics, John R. Dennison, C. D. Thomson, Alec Sim

All Physics Faculty Publications

Studies of secondary and backscattered electron yield curves of thin-film dielectrics have recently been made using pulsed, low current electron beam methods to minimize insulator charging. These capabilities have allowed us to investigate the evolution of surface and internal charge profiles as a function of low energy electron (keV) pulsed-electron fluence to determine how quickly insulators charge, and how this can affect subsequent electron emission properties. We have also studied critical incident electron energies that result in electrical breakdown of insulator materials and the effect of breakdown on subsequent emission, charging and conduction. The qualitative physics of such processes in …