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Low Temperature Cathodoluminescence Of Space Observatory Materials, Amberly Evans Jensen, Gregory Wilson, Justin Dekany, Jr Dennison
Low Temperature Cathodoluminescence Of Space Observatory Materials, Amberly Evans Jensen, Gregory Wilson, Justin Dekany, Jr Dennison
Conference Proceedings
In recent charging studies, a discernable glow was detected emanating from sample surfaces undergoing electron beam bombardment that resulted from a luminescent effect termed cathodoluminescence. This suggests that some of the materials used as optical elements, structural components, and thermal control surfaces in the construction of space-based observatories might luminesce when exposed to sufficiently energetic charged particle fluxes from the space plasma environment. If these visible, infrared and ultraviolet emissions are intense enough, they can potentially produce optical contamination detrimental to the performance of the observatory optical elements and sensors, and act to limit their sensitivity and performance windows. As …
Charging Effects Of Multilayered Dielectric Spacecraft Materials: Surface Voltage, Discharge And Arcing, Gregory Wilson, Amberly Evans Jensen, Justin Dekany, Jr Dennison
Charging Effects Of Multilayered Dielectric Spacecraft Materials: Surface Voltage, Discharge And Arcing, Gregory Wilson, Amberly Evans Jensen, Justin Dekany, Jr Dennison
Conference Proceedings
Charging of thin-film, multilayer dielectric materials subject to electron bombardment was found to evolve with time. The charging behavior was also highly dependent on the incident energy of the monoenergetic electron beams; this is driven by energy dependant processes including the electron penetration depth, electron emission, and material conductivity. The electron penetration depth is the average range to which incident electrons at a given incident energy penetrate into the material, thus defining the mean depth of an embedded charge layer. The secondary electron yield is the ratio of electrons emitted from the surface to the number of incident electrons; this …