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Utah State University

Series

2013

Dielectrics

Articles 1 - 2 of 2

Full-Text Articles in Physics

Pulsed Electro-Acoustic (Pea) Measurements Of Embedded Charge Distributions, Jr Dennison, Lee H. Pearson Sep 2013

Pulsed Electro-Acoustic (Pea) Measurements Of Embedded Charge Distributions, Jr Dennison, Lee H. Pearson

Conference Proceedings

Knowledge of the spatial distribution and evolution of embedded charge in thin dielectric materials has important applications in semiconductor, high-power electronic device, high-voltage DC power cable insulation, high-energy and plasma physics apparatus, and spacecraft industries. Knowing how, where, and how much charge accumulates and how it redistributes and dissipates can predict destructive charging effects. Pulsed Electro-acoustic (PEA) measurements— and two closely related methods, Pressure Wave Propagation (PWP) and Laser Intensity Modulation (LIMM)— nondestructively probe such internal charge distributions. We review the instrumentation, methods, theory and signal processing of simple PEA experiments, as well as the related PPW and LIMM methods. …


Electron Energy Dependent Charging Effects Of Multilayered Dielectric Material, Gregory Wilson, Jr Dennison, Amberly Evans Jensen, Justin Dekany Jan 2013

Electron Energy Dependent Charging Effects Of Multilayered Dielectric Material, Gregory Wilson, Jr Dennison, Amberly Evans Jensen, Justin Dekany

Graduate Student Publications

Measurements of the charge distribution in electron-bombarded, thin-film, and multilayer dielectric samples showed that charging of multilayered materials evolves with time and is highly dependent on incident energy; this is driven by electron penetration depth, electron emission, and material conductivity. Based on the net surface potential’s dependence on beam current, electron range, electron emission, and conductivity, measurements of the surface potential, displacement current, and beam energy allow the charge distribution to be inferred. To take these measurements, a thin-film disordered SiO2 structure with a conductive middle layer was charged using 200-eV and 5-keV electron beams with regular 15-s pulses at …