Physics Commons^™

Physics-Driven Dual-Defect Model Fits Of Voltage Step-Up To Breakdown Data In Spacecraft Polymers, Allen Andersen, Jr Dennison

Journal Articles

Overly conservative estimates of breakdown strength can increase the mass and cost of spacecraft electrostatic discharge (ESD) mitigation methods. Improved estimates of ESD likelihood in the space environment require better models of ESD distributions. The purpose of this work is to evaluate our previously proposed dual-defect model of voltage step-up-to-breakdown tests with a case study across four dielectric materials. We predicted that materials best fit by mixed Weibull distributions would exhibit better fits with the dual-defect model compared to a mean field single defect theory. Additional data for biaxially oriented polypropylene (BOPP), polyimide (PI or Kapton) from three sources, and …

Temperature Dependence Of Radiation Induced Conductivity In Insulators, Jr Dennison, Jodie Corbridge Gillespie, Joshua Hodges, Ryan C. Hoffman, J Abott, Steven Hart, Alan W. Hunt

Journal Articles

We report on measurements of Radiation Induced Conductivity (RIC) of thin film Low Density Polyethylene (LDPE) samples. RIC occurs when incident ionizing radiation deposits energy in a material and excites electrons into conduction states. RIC is calculated as the difference in sample conductivity under an incident flux and “dark current” conductivity under no incident radiation.

The primary focus of this study is the temperature dependence of the steady state RIC over a wide range of absorbed dose rates, from cryogenic temperatures to well above room temperature. The measured RIC values are compared to theoretical predictions of dose rate and temperature …

Low-Fluence Electron Yields Of Highly Insulating Materials, Ryan Hoffmann, Jr Dennison, Clint D. Thomson, Jennifer Albretson

Journal Articles

Electron-induced electron yields of high-resistivity, high-yield materials - ceramic polycrystalline aluminum oxide and the polymer polyimide (Kapton HN), - were made by using a low-fluence, pulsed incident electron beam and charge neutralization electron source to minimize charge accumulation. Large changes in energy-dependent total yield curves and yield decay curves were observed, even for incident electron fluences of <3 fC/mm². The evolution of the electron yield as charge accumulates in the material is modeled in terms of electron re-capture based on an extended Chung-Everhart model of the electron emission spectrum. This model is used to explain anomalies measured in highly insulating, …