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- Dispersion (1)
- Electron emission (1)
- Electron microscopes (1)
- Electron microscopy (1)
- Electron or ion microscopes (1)
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- Electron spectroscopy (1)
- Electron- or ion-diffraction tubes (1)
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- Ultrafast electron microscopy; Photon-induced near field electron microscopy; PINEM; fs-Resolved transmission electron microscopy; Dynamic transmission electron microscopy (1)
Articles 1 - 2 of 2
Full-Text Articles in Physics
Design And Implementation Of A Fs-Resolved Transmission Electron Microscope Based On Thermionic Gun Technology [Post-Print], L. Piazza, D. J. Masiel, T. Lagrange, B. W. Reed, Brett Barwick
Design And Implementation Of A Fs-Resolved Transmission Electron Microscope Based On Thermionic Gun Technology [Post-Print], L. Piazza, D. J. Masiel, T. Lagrange, B. W. Reed, Brett Barwick
Faculty Scholarship
In this paper, the design and implementation of a femtosecond-resolved ultrafast transmission electron microscope is presented, based on a thermionic gun geometry. Utilizing an additional magnetic lens between the electron acceleration and the nominal condenser lens system, a larger percentage of the electrons created at the cathode are delivered to the specimen without degrading temporal, spatial and energy resolution significantly, while at the same time maintaining the femtosecond temporal resolution. Using the photon-induced near field electron microscopy effect (PINEM) on silver nanowires the cross-correlation between the light and electron pulses was measured, showing the impact of the gun settings and …
Femtosecond Photoelectron Point Projection Microscope, Erik Quinonez, Jonathan Handali, Brett Barwick
Femtosecond Photoelectron Point Projection Microscope, Erik Quinonez, Jonathan Handali, Brett Barwick
Faculty Scholarship
By utilizing a nanometer ultrafast electron source in a point projection microscope we demonstrate that images of nanoparticles with spatial resolutions of the order of 100 nanometers can be obtained. The duration of the emission process of the photoemitted electrons used to make images is shown to be of the order of 100 fs using an autocorrelation technique. The compact geometry of this photoelectron point projection microscope does not preclude its use as a simple ultrafast electron microscope, and we use simple analytic models to estimate temporal resolutions that can be expected when using it as a pump-probe ultrafast electron …