Open Access. Powered by Scholars. Published by Universities.®
- Publication
- File Type
Articles 1 - 3 of 3
Full-Text Articles in Physics
Electron Induced Charging And Arcing Of Multilayered Dielectric Materials, Jr Dennison, Gregory Wilson, Amberly Evans, Justin Dekany
Electron Induced Charging And Arcing Of Multilayered Dielectric Materials, Jr Dennison, Gregory Wilson, Amberly Evans, Justin Dekany
Amberly Evans
Measurements of the charge distribution in electron-bombarded, thin-film, multilayered dielectric samples showed that charging of multilayered materials evolves with time and is highly dependent on incident energy; this is driven by electron penetration depth, electron emission and material conductivity. Based on the net surface potential’s dependence on beam current, electron range, electron emission and conductivity, measurements of the surface potential, displacement current and beam energy allow the charge distribution to be inferred. To take these measurements, a thin-film disordered SiO2 structure with a conductive middle layer was charged using 200 eV and 5 keV electron beams with regular 15 s …
Electron Induced Charging And Arcing Of Multilayered Dielectric Materials, Jr Dennison, Gregory Wilson, Amberly Evans, Justin Dekany
Electron Induced Charging And Arcing Of Multilayered Dielectric Materials, Jr Dennison, Gregory Wilson, Amberly Evans, Justin Dekany
Gregory Wilson
Measurements of the charge distribution in electron-bombarded, thin-film, multilayered dielectric samples showed that charging of multilayered materials evolves with time and is highly dependent on incident energy; this is driven by electron penetration depth, electron emission and material conductivity. Based on the net surface potential’s dependence on beam current, electron range, electron emission and conductivity, measurements of the surface potential, displacement current and beam energy allow the charge distribution to be inferred. To take these measurements, a thin-film disordered SiO2 structure with a conductive middle layer was charged using 200 eV and 5 keV electron beams with regular 15 s …
Electron Induced Charging And Arcing Of Multilayered Dielectric Materials, Jr Dennison, Gregory Wilson, Amberly Evans, Justin Dekany
Electron Induced Charging And Arcing Of Multilayered Dielectric Materials, Jr Dennison, Gregory Wilson, Amberly Evans, Justin Dekany
Justin Dekany
Measurements of the charge distribution in electron-bombarded, thin-film, multilayered dielectric samples showed that charging of multilayered materials evolves with time and is highly dependent on incident energy; this is driven by electron penetration depth, electron emission and material conductivity. Based on the net surface potential’s dependence on beam current, electron range, electron emission and conductivity, measurements of the surface potential, displacement current and beam energy allow the charge distribution to be inferred. To take these measurements, a thin-film disordered SiO2 structure with a conductive middle layer was charged using 200 eV and 5 keV electron beams with regular 15 s …