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Apparent And True Feature Heights In Force Microscopy, Nancy Burnham
Apparent And True Feature Heights In Force Microscopy, Nancy Burnham
Nancy A. Burnham
In a force microscope, the stiffness of the cantilever beam convolutes with the tip‐sample interaction stiffness to influence the data in a systematic way. The analysis presented here relates the measured feature height to the true feature height in the variable force, constant force, and constant force gradient modes of operation. In this way, one can understand previously published data: the enhanced measured atomic corrugation observed in high resolution force microscopy images, its increase with load, and the improved resolution of lateral force images. The correct interaction stiffness can be obtained for use in surface force and mechanical properties studies. …
Interpretation Issues In Force Microscopy, Nancy Burnham, Richard Colton, Hubert Pollock
Interpretation Issues In Force Microscopy, Nancy Burnham, Richard Colton, Hubert Pollock
Nancy A. Burnham
In this paper, we will discuss force microscopy (FM) and its potential for determining mechanical properties of thin films. We will introduce the basic principles of FM, and demonstrate how FM can be used to determine materials properties as well as image surface topography, both with nanonewton or sub‐nanonewton force resolution and sub‐nanometer position resolution. As FM is still a new field, not all of the questions concerning interpretation have been fully answered. We will elucidate four current issues that must be resolved before the full potential of FM can be realized. They are: (1) the role of water vapor …