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Phase Imaging: Deep Or Superficial?, Nancy Burnham, O Behrend, L Odoni, J Loubet
Phase Imaging: Deep Or Superficial?, Nancy Burnham, O Behrend, L Odoni, J Loubet
Nancy A. Burnham
Phase images acquired while intermittently contacting a sample surface with the tip of an atomic force microscope cantilever are not easy to relate to material properties. We have simulated dynamic force curves and compared simulated with experimental results. For some cantilever–sample combinations, the interaction remains a surface effect, whereas for others, the tip penetrates the sample significantly. Height artifacts in the “topography” images, and the role of the sample stiffness, work of adhesion, damping, and topography in the cantilever response manifest themselves to different extents depending on the indentation depth.
Stiffness Of Measurement System And Significant Figures Of Displacement Which Are Required To Interpret Adhesional Force Curves, Nancy Burnham, Kunio Takahashi, Hubert Pollock, Tadao Onzawa
Stiffness Of Measurement System And Significant Figures Of Displacement Which Are Required To Interpret Adhesional Force Curves, Nancy Burnham, Kunio Takahashi, Hubert Pollock, Tadao Onzawa
Nancy A. Burnham
Force curves obtained from an elastic contact theory are shown and compared with experimental results. In the elastic contact theory, a pin-on-disk contact is assumed and the following interaction are taken into consideration; (i) elastic deformation, (ii) the specific energy of adhesion in the area of the contact, which is expressed as the difference between the surface energies and the interface energy, (iii) the long-range interaction outside the area of contact, assuming the additivity of the Lennard-Jones type potential, and (iv) another elastic term for the measurement system such as the cantilever stiffness of an atomic force microscope (AFM). In …