Physics Commons^™

Classifying Pattern Formation In Materials Via Machine Learning, Lukasz Burzawa, Shuo Liu, Erica W. Carlson

The Summer Undergraduate Research Fellowship (SURF) Symposium

Scanning probe experiments such as scanning tunneling microscopy (STM) and atomic force microscopy (AFM) on strongly correlated materials often reveal complex pattern formation that occurs on multiple length scales. We have shown in two disparate correlated materials that the pattern formation is driven by proximity to a disorder-driven critical point. We developed new analysis concepts and techniques that relate the observed pattern formation to critical exponents by analyzing the geometry and statistics of clusters observed in these experiments and converting that information into critical exponents. Machine learning algorithms can be helpful correlating data from scanning probe experiments to theoretical models …