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Ultrafast High-Energy Electron Diffraction Study Of Photoexcited Bismuth Nanoclusters By Femtosecond Laser Pulses, Ahmed R. Esmail Apr 2011

Ultrafast High-Energy Electron Diffraction Study Of Photoexcited Bismuth Nanoclusters By Femtosecond Laser Pulses, Ahmed R. Esmail

Electrical & Computer Engineering Theses & Dissertations

The advancement in ultrafast electron crystallography (UEC) over the past few decades facilitated the study of structural dynamics in all phases of matter induced by femtosecond laser pulses. This technique became very powerful when the spatial resolution was combined with the temporal resolution, and succeeded in studying chemical reactions by ultrafast electron diffraction, bulk crystal phonons and melting by X-ray diffraction.

In this dissertation, I demonstrate the uniqueness of UEC and its potential in monitoring in real time the structural dynamics of bismuth (Bi) nanoclusters and islands induced by femtosecond laser pulses. Our approach to accomplish this task includes building …


Anisotropic Response Of Nanosized Bismuth Films Upon Femtosecond Laser Excitation Monitored By Ultrafast Electron Diffraction, Ahmed R. Esmail, Hani E. Elsayed-Ali Jan 2011

Anisotropic Response Of Nanosized Bismuth Films Upon Femtosecond Laser Excitation Monitored By Ultrafast Electron Diffraction, Ahmed R. Esmail, Hani E. Elsayed-Ali

Electrical & Computer Engineering Faculty Publications

The lattice response of 5 nm thick bismuth film to femtosecond laser excitation is probed by ultrafast electron diffraction. The transient decay time after laser excitation is greater for diffraction from (012) lattice planes compared to (110) planes and is reduced for both planes with the increased laser fluence. These results indicate that different energy coupling mechanisms to the lattice occur depending on the crystal direction. The behavior of the diffraction peak width indicates partial disorder of the film upon photoexcitation that increases together with the laser fluence. © 2011 American Institute of Physics. [doi:10.1063/1.3652919]