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Time-Of-Flight Emission Profiles Of The Entire Plume Using Fast Imaging During Pulsed Laser Deposition Of Yba2Cu3O7−X, Carl J. Druffner, Glen P. Perram, Rand R. Biggers

Faculty Publications

Emission time-of-flight (TOF) profiles have been obtained using gated imagery to further the process control during the pulsed laser deposition of the high temperature superconductor, YBa₂Cu₃O_7−x⁠. An intensified charge coupled device array was used to obtain a sequence of plume images at 10ns temporal resolution and 0.2mm spatial resolution. Plume imagery is transformed to TOF profiles and pulse-to-pulse variations removed using physically based smoothing techniques. Comparison with non-imaging sensors establishes excellent agreement, with systematic uncertainties in streaming speed and temperatures of less than 15% and 8%, respectively. The resulting streaming speeds of 0.4–1.2×10 …