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Full-Text Articles in Physics
Erratum: "Imaging The Three‐Dimensional Orientation And Rotational Mobility Of Fluorescent Emitters Using The Tri‐Spot Point Spread Function", Oumeng Zhang, Jin Lu, Tianben Ding, Matthew D. Lew
Erratum: "Imaging The Three‐Dimensional Orientation And Rotational Mobility Of Fluorescent Emitters Using The Tri‐Spot Point Spread Function", Oumeng Zhang, Jin Lu, Tianben Ding, Matthew D. Lew
Electrical & Systems Engineering Publications and Presentations
In the original paper, a calibration error exists in the image-formation model used to analyze experimental images taken by our microscope, causing a bias in the orientation measurements in Figs. 2 and 3. The updated measurements are shown in Fig. E1. We have also updated the supplementary material for the original article to discuss the revised PSF model and estimation algorithms (supplementary material 2) and show the revised model and measurements (Figs. S1, S3, S7, S8, and S10–S13).
Charge Storage In Wo³ Polymorphs And Their Application As Supercapacitor Electrode Material, Vaibhav Lokhande, Abhishek Lokhande, Gon Namkoong, Jin Hyeok Kim, Taeksoo Ji
Charge Storage In Wo³ Polymorphs And Their Application As Supercapacitor Electrode Material, Vaibhav Lokhande, Abhishek Lokhande, Gon Namkoong, Jin Hyeok Kim, Taeksoo Ji
Electrical & Computer Engineering Faculty Publications
Tungsten oxide is a versatile material with different applications. It has many polymorphs with varying performance in energy storage application. We report simple and facile way to synthesize four phases of tungsten oxide from same precursor materials only by changing the pH and temperature values. Monoclinic, hexagonal, orthorhombic and tetragonal phase obtained, were analyzed and tested for supercapacitor application. The electrochemical analysis of four phases indicates that the hexagonal phase is best-suited electrode material for supercapacitor. The hexagonal phase exhibits higher specific capacitance (377.5 Fg-1 at 2 mVs-1), higher surface capacitive contribution (75%), better stability and rate …
Photoemission Electron Microscopy To Characterize Slow Light In A Photonic Crystal Line Defect, Theodore Stedmark, Rolf Könenkamp
Photoemission Electron Microscopy To Characterize Slow Light In A Photonic Crystal Line Defect, Theodore Stedmark, Rolf Könenkamp
Physics Faculty Publications and Presentations
Using femtosecond nonlinear photoemission electron microscopy (PEEM) we provide a detailed characterization of slow light in a small-size asymmetric photonic crystal structure. We show that PEEM is capable of providing a unique description of the light propagation in such structures by direct imaging of the guided mode. This noninvasive characterization technique allows modal properties such as effective index, phase velocities, and group velocities to be determined. Combining experimental results with finite element method simulation calculations, we study slow light phenomena in a photonic crystal defect mode, and we produce a comprehensive picture of the mechanisms behind it. Our results illustrate …