Physics Commons^™

Electron Yield Measurements Of Multilayer Conductive Materials, Gregory Wilson, Matthew Robertson, Jordan Lee, Jr Dennison

Conference Proceedings

As energetic electrons interact with the surface of materials, they impart energy throughout the material. If the energy exchange is near the surface, secondary electrons within the material can be excited and emitted. It is also possible for the incident primary electron to undergo a quasi-elastic collision within the material, wherein the electron is backscattered and emitted from the surface. As the backscattered electron is leaving the material, it can continue to impart energy to the material, potentially exciting more secondary electrons as it approaches the surface on the way back out.

This process of imparting energy and charge to …

Measurement Of Angle-Resolved Secondary Electron Spectra, Robert Davies

All Graduate Theses and Dissertations, Spring 1920 to Summer 2023

Theoretical formulations of secondary electron emission over the past 20 years have exceeded the confirming ability of available measurements. An instrument has been developed and tested for the purpose of obtaining simultaneous angle- and energy-resolved (AER) secondary and backscattered electron measurements for energetic electrons incident on conducting surfaces. The instrument is found to be in good working order and the data quality found to be excellent for nearly all angles and energies investigated. A representative set of AER measurements has been acquired for 1500 eV electrons normally incident on polycrystalline gold. The data have been used to construct angle-resolved (AR) …

An Instrument For Experimental Secondary Electron Emission Investigations, With Application To The Spacecraft Charging Problem, Robert Davies

All Graduate Theses and Dissertations, Spring 1920 to Summer 2023

Secondary electron emission (SEE) and incident-particle backscattering are important processes accompanying the impact of energetic electrons and ions on surfaces. The phenomena play a key role in the buildup of electrical charge on spacecraft surfaces. and are therefore of particular interest to scientists attempting to model spacecraft charging. In response to a demonstrated need for data, techniques for determining total secondary electron (SE) and backscatter (BS) yields S and n, and associated scattering-angle-resolved, scattering-energy-resolved, and simultaneous angle-energy-resolved yields have been developed. Further, an apparatus capable of making the necessary measurements for experimental determination of these quantities-for conducting materials in …