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The Importance Of Accurate Computation Of Secondary Electron Emission For Modeling Spacecraft Charging, S. Clerc, John R. Dennison, C. D. Thomson
The Importance Of Accurate Computation Of Secondary Electron Emission For Modeling Spacecraft Charging, S. Clerc, John R. Dennison, C. D. Thomson
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Secondary electron emission is a critical contributor to the current balance in spacecraft charging. Spacecraft charging codes use a parameterized expression for the secondary electron yield δ(Eo) as a function of incident electron energy Eo. Simple three-step physics models of the electron penetration, transport and emission from a solid are typically expressed in terms of the incident electron penetration depth at normal incidence or range R(Eo ), and the mean free path of the secondary electron, λ(E). We recall classical models for the range R(Eo): a power law expression of the form b1Eon1 …
Proposed Modifications To Engineering Design Guidelines Related To Resistivity Measurements And Spacecraft Charging, John R. Dennison, Prasanna Swaminathan, Randy Jost, Jerilyn Brunson, Nelson W. Green, A. Robb Frederickson
Proposed Modifications To Engineering Design Guidelines Related To Resistivity Measurements And Spacecraft Charging, John R. Dennison, Prasanna Swaminathan, Randy Jost, Jerilyn Brunson, Nelson W. Green, A. Robb Frederickson
All Physics Faculty Publications
A key parameter in modeling differential spacecraft charging is the resistivity of insulating materials. This parameter determines how charge will accumulate and redistribute across the spacecraft, as well as the time scale for charge transport and dissipation. Existing spacecraft charging guidelines recommend use of tests and imported resistivity data from handbooks that are based principally upon ASTM methods that are more applicable to classical ground conditions and designed for problems associated with power loss through the dielectric, than for how long charge can be stored on an insulator. These data have been found to underestimate charging effects by one to …