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Particle-In-Cell Simulations Of Ion Dynamics In A Pinched-Beam Diode, Jesse C. Foster, John W. Mcclory, S. B. B. Swanekamp, D. D. Hinshelwood, A. S. Richardson, Paul E. Adamson, J. W. Schumer, R. W. James, P. F. Ottinger, D. Mosher
Particle-In-Cell Simulations Of Ion Dynamics In A Pinched-Beam Diode, Jesse C. Foster, John W. Mcclory, S. B. B. Swanekamp, D. D. Hinshelwood, A. S. Richardson, Paul E. Adamson, J. W. Schumer, R. W. James, P. F. Ottinger, D. Mosher
Faculty Publications
article-in-cell simulations of a 1.6 MV, 800 kA, and 50 ns pinched-beam diode have been completed with emphasis placed on the quality of the ion beams produced. Simulations show the formation of multiple regions in the electron beam flow characterized by locally high charge and current density (“hot spots”). As ions flow through the electron-space-charge cloud, these hot spots electrostatically attract ions to produce a non-uniform ion current distribution. The length of the cavity extending beyond the anode-to-cathode gap (i.e., behind the cathode tip) influences both the number and amplitude of hot spots. A longer cavity length increases the number …